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Characterization of solid state reactions and crystallization in thin films using in situ X-ray diffraction

Werner Knaepen (UGent)
(2010)
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(UGent) and (UGent)
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Citation

Please use this url to cite or link to this publication:

MLA
Knaepen, Werner. Characterization of Solid State Reactions and Crystallization in Thin Films Using in Situ X-Ray Diffraction. Ghent University. Faculty of Sciences, 2010.
APA
Knaepen, W. (2010). Characterization of solid state reactions and crystallization in thin films using in situ X-ray diffraction. Ghent University. Faculty of Sciences, Ghent, Belgium.
Chicago author-date
Knaepen, Werner. 2010. “Characterization of Solid State Reactions and Crystallization in Thin Films Using in Situ X-Ray Diffraction.” Ghent, Belgium: Ghent University. Faculty of Sciences.
Chicago author-date (all authors)
Knaepen, Werner. 2010. “Characterization of Solid State Reactions and Crystallization in Thin Films Using in Situ X-Ray Diffraction.” Ghent, Belgium: Ghent University. Faculty of Sciences.
Vancouver
1.
Knaepen W. Characterization of solid state reactions and crystallization in thin films using in situ X-ray diffraction. [Ghent, Belgium]: Ghent University. Faculty of Sciences; 2010.
IEEE
[1]
W. Knaepen, “Characterization of solid state reactions and crystallization in thin films using in situ X-ray diffraction,” Ghent University. Faculty of Sciences, Ghent, Belgium, 2010.
@phdthesis{8631092,
  author       = {Knaepen, Werner},
  language     = {eng},
  pages        = {X, 203},
  publisher    = {Ghent University. Faculty of Sciences},
  school       = {Ghent University},
  title        = {Characterization of solid state reactions and crystallization in thin films using in situ X-ray diffraction},
  year         = {2010},
}