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In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays

Alexandra Kourfali (UGent) and Dirk Stroobandt (UGent)
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Abstract
Reassuring fault tolerance in computing systems is an important problem in high-reliability applications. With the interest in commercial SRAM-based FPGAs in radiation environments, it is beneficial to provide runtime reconfigurable recovery from a failure. In this paper a virtual coarse-grained reconfigurable architecture is proposed, with an embedded on-demand fault-mitigation technique tailored for FPGA overlays. The proposed method performs spatial redundancy and run-time recovery. This approach can achieve up to 3 x faster runtime recovery with 20% less resources in FPGA devices, by providing integrated layers of fault mitigation.
Keywords
Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Radiation sensitivity, Single event upsets, Fault tolerance, SRAM-based FPGAs, Reconfiguration, Scrubbing, Triple modular redundancy, ERROR-DETECTION

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Citation

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MLA
Kourfali, Alexandra, and Dirk Stroobandt. “In-Circuit Fault Tolerance for FPGAs Using Dynamic Reconfiguration and Virtual Overlays.” MICROELECTRONICS RELIABILITY, vol. 102, 2019.
APA
Kourfali, A., & Stroobandt, D. (2019). In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays. MICROELECTRONICS RELIABILITY, 102.
Chicago author-date
Kourfali, Alexandra, and Dirk Stroobandt. 2019. “In-Circuit Fault Tolerance for FPGAs Using Dynamic Reconfiguration and Virtual Overlays.” MICROELECTRONICS RELIABILITY 102.
Chicago author-date (all authors)
Kourfali, Alexandra, and Dirk Stroobandt. 2019. “In-Circuit Fault Tolerance for FPGAs Using Dynamic Reconfiguration and Virtual Overlays.” MICROELECTRONICS RELIABILITY 102.
Vancouver
1.
Kourfali A, Stroobandt D. In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays. MICROELECTRONICS RELIABILITY. 2019;102.
IEEE
[1]
A. Kourfali and D. Stroobandt, “In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays,” MICROELECTRONICS RELIABILITY, vol. 102, 2019.
@article{8624731,
  abstract     = {Reassuring fault tolerance in computing systems is an important problem in high-reliability applications. With the interest in commercial SRAM-based FPGAs in radiation environments, it is beneficial to provide runtime reconfigurable recovery from a failure. In this paper a virtual coarse-grained reconfigurable architecture is proposed, with an embedded on-demand fault-mitigation technique tailored for FPGA overlays. The proposed method performs spatial redundancy and run-time recovery. This approach can achieve up to 3 x faster runtime recovery with 20% less resources in FPGA devices, by providing integrated layers of fault mitigation.},
  articleno    = {113438},
  author       = {Kourfali, Alexandra and Stroobandt, Dirk},
  issn         = {0026-2714},
  journal      = {MICROELECTRONICS RELIABILITY},
  keywords     = {Electrical and Electronic Engineering,Atomic and Molecular Physics,and Optics,Electronic,Optical and Magnetic Materials,Surfaces,Coatings and Films,Safety,Risk,Reliability and Quality,Condensed Matter Physics,Radiation sensitivity,Single event upsets,Fault tolerance,SRAM-based FPGAs,Reconfiguration,Scrubbing,Triple modular redundancy,ERROR-DETECTION},
  language     = {eng},
  title        = {In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays},
  url          = {http://dx.doi.org/10.1016/j.microrel.2019.113438},
  volume       = {102},
  year         = {2019},
}

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