Advanced search
1 file | 982.43 KB Add to list
Author
Organization

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 982.43 KB

Citation

Please use this url to cite or link to this publication:

MLA
Tajalli, A., et al. “Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-Mode Transistors.” 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), IEEE, 2019.
APA
Tajalli, A., Canato, E., Nardo, A., Meneghini, M., Stockman, A., Moens, P., … Meneghesso, G. (2019). Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors. In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). Monterey, CA: IEEE.
Chicago author-date
Tajalli, A., E. Canato, A. Nardo, M. Meneghini, Arno Stockman, Peter Moens, E. Zanoni, and G. Meneghesso. 2019. “Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-Mode Transistors.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE.
Chicago author-date (all authors)
Tajalli, A., E. Canato, A. Nardo, M. Meneghini, Arno Stockman, Peter Moens, E. Zanoni, and G. Meneghesso. 2019. “Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-Mode Transistors.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE.
Vancouver
1.
Tajalli A, Canato E, Nardo A, Meneghini M, Stockman A, Moens P, et al. Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors. In: 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE; 2019.
IEEE
[1]
A. Tajalli et al., “Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors,” in 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), Monterey, CA, 2019.
@inproceedings{8617778,
  author       = {Tajalli, A. and Canato, E. and Nardo, A. and Meneghini, M. and Stockman, Arno and Moens, Peter and Zanoni, E. and Meneghesso, G.},
  booktitle    = {2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)},
  isbn         = {9781538695043},
  issn         = {1541-7026},
  language     = {eng},
  location     = {Monterey, CA},
  publisher    = {IEEE},
  title        = {Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors},
  url          = {http://dx.doi.org/10.1109/irps.2019.8720445},
  year         = {2019},
}

Altmetric
View in Altmetric
Web of Science
Times cited: