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Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors

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Chicago
Tajalli, A., E. Canato, A. Nardo, M. Meneghini, Arno Stockman, Pieter Moens, E. Zanoni, and G. Meneghesso. 2019. “Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-mode Transistors .” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) IEEE.
APA
Tajalli, A., Canato, E., Nardo, A., Meneghini, M., Stockman, A., Moens, P., Zanoni, E., et al. (2019). Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors . 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) . Presented at the IEEE International Reliability Physics Symposium (IRPS) , IEEE.
Vancouver
1.
Tajalli A, Canato E, Nardo A, Meneghini M, Stockman A, Moens P, et al. Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors . 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) . IEEE; 2019.
MLA
Tajalli, A. et al. “Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-mode Transistors .” 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) . IEEE, 2019. Print.
@inproceedings{8617778,
  author       = {Tajalli, A. and Canato, E. and Nardo, A. and Meneghini, M. and Stockman, Arno and Moens, Pieter and Zanoni, E. and Meneghesso, G.},
  booktitle    = {2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) },
  isbn         = {9781538695043},
  issn         = {1541-7026 },
  language     = {eng},
  location     = {Monterey, CA },
  publisher    = {IEEE},
  title        = {Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors },
  url          = {http://dx.doi.org/10.1109/irps.2019.8720445},
  year         = {2019},
}

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