A physical-statistical approach to AlGaN/GaN HEMT reliability
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- Peter Moens and Arno Stockman (UGent)
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Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8617773
- MLA
- Moens, Peter, and Arno Stockman. “A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability.” 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), IEEE, 2019.
- APA
- Moens, P., & Stockman, A. (2019). A physical-statistical approach to AlGaN/GaN HEMT reliability. In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). Monterey, CA, USA: IEEE.
- Chicago author-date
- Moens, Peter, and Arno Stockman. 2019. “A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE.
- Chicago author-date (all authors)
- Moens, Peter, and Arno Stockman. 2019. “A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE.
- Vancouver
- 1.Moens P, Stockman A. A physical-statistical approach to AlGaN/GaN HEMT reliability. In: 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE; 2019.
- IEEE
- [1]P. Moens and A. Stockman, “A physical-statistical approach to AlGaN/GaN HEMT reliability,” in 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), Monterey, CA, USA, 2019.
@inproceedings{8617773,
articleno = {8720521},
author = {Moens, Peter and Stockman, Arno},
booktitle = {2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)},
isbn = {9781538695050},
issn = {1541-7026},
language = {eng},
location = {Monterey, CA, USA},
pages = {6},
publisher = {IEEE},
title = {A physical-statistical approach to AlGaN/GaN HEMT reliability},
url = {http://dx.doi.org/10.1109/irps.2019.8720521},
year = {2019},
}
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