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Citation

Please use this url to cite or link to this publication:

MLA
Moens, Peter, and Arno Stockman. “A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability.” 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), IEEE, 2019.
APA
Moens, P., & Stockman, A. (2019). A physical-statistical approach to AlGaN/GaN HEMT reliability. In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). Monterey, CA, USA: IEEE.
Chicago author-date
Moens, Peter, and Arno Stockman. 2019. “A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE.
Chicago author-date (all authors)
Moens, Peter, and Arno Stockman. 2019. “A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE.
Vancouver
1.
Moens P, Stockman A. A physical-statistical approach to AlGaN/GaN HEMT reliability. In: 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE; 2019.
IEEE
[1]
P. Moens and A. Stockman, “A physical-statistical approach to AlGaN/GaN HEMT reliability,” in 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), Monterey, CA, USA, 2019.
@inproceedings{8617773,
  articleno    = {8720521},
  author       = {Moens, Peter and Stockman, Arno},
  booktitle    = {2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)},
  isbn         = {9781538695050},
  issn         = {1541-7026},
  language     = {eng},
  location     = {Monterey, CA, USA},
  pages        = {6},
  publisher    = {IEEE},
  title        = {A physical-statistical approach to AlGaN/GaN HEMT reliability},
  url          = {http://dx.doi.org/10.1109/irps.2019.8720521},
  year         = {2019},
}

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