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Citation

Please use this url to cite or link to this publication:

Chicago
Moens, Peter, and Arno Stockman. 2019. “A Physical-statistical Approach to AlGaN/GaN HEMT Reliability.” In 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) IEEE.
APA
Moens, Peter, & Stockman, A. (2019). A physical-statistical approach to AlGaN/GaN HEMT reliability. 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) . Presented at the IEEE International Reliability Physics Symposium (IRPS) , IEEE.
Vancouver
1.
Moens P, Stockman A. A physical-statistical approach to AlGaN/GaN HEMT reliability. 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) . IEEE; 2019.
MLA
Moens, Peter, and Arno Stockman. “A Physical-statistical Approach to AlGaN/GaN HEMT Reliability.” 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) . IEEE, 2019. Print.
@inproceedings{8617773,
  articleno    = {8720521},
  author       = {Moens, Peter and Stockman, Arno},
  booktitle    = {2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) },
  isbn         = {9781538695050},
  issn         = {1541-7026},
  language     = {eng},
  location     = {Monterey, CA, USA},
  pages        = {6},
  publisher    = {IEEE},
  title        = {A physical-statistical approach to AlGaN/GaN HEMT reliability},
  url          = {http://dx.doi.org/10.1109/irps.2019.8720521},
  year         = {2019},
}

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