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Multi-beam microscopy free of sample-induced phase distortions

Alejandro Diaz Tormo (UGent) , Dmitry Khalenkow (UGent) , Andre Skirtach (UGent) and Nicolas Le Thomas (UGent)
Author
Organization
Project
Center for nano- and biophotonics (NB-Photonics)

Citation

Please use this url to cite or link to this publication:

Chicago
Diaz Tormo, Alejandro, Dmitry Khalenkow, Andre Skirtach, and Nicolas Le Thomas. 2018. “Multi-beam Microscopy Free of Sample-induced Phase Distortions.” In IEEE Photonics Benelux Chapter, 23rd Annual Symposium, Abstracts.
APA
Diaz Tormo, A., Khalenkow, D., Skirtach, A., & Le Thomas, N. (2018). Multi-beam microscopy free of sample-induced phase distortions. IEEE Photonics Benelux Chapter, 23rd Annual symposium, Abstracts. Presented at the 23rd Annual symposium of the IEEE Photonics Benelux Chapter.
Vancouver
1.
Diaz Tormo A, Khalenkow D, Skirtach A, Le Thomas N. Multi-beam microscopy free of sample-induced phase distortions. IEEE Photonics Benelux Chapter, 23rd Annual symposium, Abstracts. 2018.
MLA
Diaz Tormo, Alejandro et al. “Multi-beam Microscopy Free of Sample-induced Phase Distortions.” IEEE Photonics Benelux Chapter, 23rd Annual Symposium, Abstracts. 2018. Print.
@inproceedings{8615713,
  author       = {Diaz Tormo, Alejandro and Khalenkow, Dmitry and Skirtach, Andre and Le Thomas, Nicolas},
  booktitle    = {IEEE Photonics Benelux Chapter, 23rd Annual symposium, Abstracts},
  language     = {eng},
  location     = {Brussels, Belgium},
  title        = {Multi-beam microscopy free of sample-induced phase distortions},
  year         = {2018},
}