Hierarchical metric learning for optical remote sensing scene categorization
- Author
- Akashdeep Goel, Biplab Banerjee and Aleksandra Pizurica (UGent)
- Organization
- Abstract
- We address the problem of scene classification from optical remote sensing (RS) images based on the paradigm of hierarchical metric learning. Ideally, supervised metric learning strategies learn a projection from a set of training data points so as to minimize intraclass variance while maximizing the interclass separability to the class label space. However, standard metric learning techniques do not incorporate the class interaction information in learning the transformation matrix, which is often considered to be a bottleneck while dealing with fine-grained visual categories. As a remedy, we propose to organize the classes in a hierarchical fashion by exploring their visual similarities and subsequently learn separate distance metric transformations for the classes present at the nonleaf nodes of the tree. We employ an iterative maximum-margin clustering strategy to obtain the hierarchical organization of the classes. Experiment results obtained on the large-scale NWPU-RESISC45 and the popular UC-Merced data sets demonstrate the efficacy of the proposed hierarchical metric learning-based RS scene recognition strategy in comparison to the standard approaches.
- Keywords
- Maximum margin clustering (MMC), metric learning, optical remote sensing (RS)
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8608733
- MLA
- Goel, Akashdeep, et al. “Hierarchical Metric Learning for Optical Remote Sensing Scene Categorization.” IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, vol. 16, no. 6, 2019, pp. 952–56, doi:10.1109/lgrs.2018.2884675.
- APA
- Goel, A., Banerjee, B., & Pizurica, A. (2019). Hierarchical metric learning for optical remote sensing scene categorization. IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, 16(6), 952–956. https://doi.org/10.1109/lgrs.2018.2884675
- Chicago author-date
- Goel, Akashdeep, Biplab Banerjee, and Aleksandra Pizurica. 2019. “Hierarchical Metric Learning for Optical Remote Sensing Scene Categorization.” IEEE GEOSCIENCE AND REMOTE SENSING LETTERS 16 (6): 952–56. https://doi.org/10.1109/lgrs.2018.2884675.
- Chicago author-date (all authors)
- Goel, Akashdeep, Biplab Banerjee, and Aleksandra Pizurica. 2019. “Hierarchical Metric Learning for Optical Remote Sensing Scene Categorization.” IEEE GEOSCIENCE AND REMOTE SENSING LETTERS 16 (6): 952–956. doi:10.1109/lgrs.2018.2884675.
- Vancouver
- 1.Goel A, Banerjee B, Pizurica A. Hierarchical metric learning for optical remote sensing scene categorization. IEEE GEOSCIENCE AND REMOTE SENSING LETTERS. 2019;16(6):952–6.
- IEEE
- [1]A. Goel, B. Banerjee, and A. Pizurica, “Hierarchical metric learning for optical remote sensing scene categorization,” IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, vol. 16, no. 6, pp. 952–956, 2019.
@article{8608733, abstract = {{We address the problem of scene classification from optical remote sensing (RS) images based on the paradigm of hierarchical metric learning. Ideally, supervised metric learning strategies learn a projection from a set of training data points so as to minimize intraclass variance while maximizing the interclass separability to the class label space. However, standard metric learning techniques do not incorporate the class interaction information in learning the transformation matrix, which is often considered to be a bottleneck while dealing with fine-grained visual categories. As a remedy, we propose to organize the classes in a hierarchical fashion by exploring their visual similarities and subsequently learn separate distance metric transformations for the classes present at the nonleaf nodes of the tree. We employ an iterative maximum-margin clustering strategy to obtain the hierarchical organization of the classes. Experiment results obtained on the large-scale NWPU-RESISC45 and the popular UC-Merced data sets demonstrate the efficacy of the proposed hierarchical metric learning-based RS scene recognition strategy in comparison to the standard approaches.}}, author = {{Goel, Akashdeep and Banerjee, Biplab and Pizurica, Aleksandra}}, issn = {{1545-598X}}, journal = {{IEEE GEOSCIENCE AND REMOTE SENSING LETTERS}}, keywords = {{Maximum margin clustering (MMC),metric learning,optical remote sensing (RS)}}, language = {{eng}}, number = {{6}}, pages = {{952--956}}, title = {{Hierarchical metric learning for optical remote sensing scene categorization}}, url = {{http://doi.org/10.1109/lgrs.2018.2884675}}, volume = {{16}}, year = {{2019}}, }
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