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Kernel-Based Distance Metric Learning for Supervised k-Means Clustering

Bac Nguyen Cong (UGent) and Bernard De Baets (UGent)
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Computer Networks and Communications, Software, Artificial Intelligence, Computer Science Applications

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Citation

Please use this url to cite or link to this publication:

Chicago
Nguyen Cong, Bac, and Bernard De Baets. 2019. “Kernel-Based Distance Metric Learning for Supervised k-Means Clustering.” IEEE Transactions on Neural Networks and Learning Systems: 1–12.
APA
Nguyen Cong, B., & De Baets, B. (2019). Kernel-Based Distance Metric Learning for Supervised k-Means Clustering. IEEE Transactions on Neural Networks and Learning Systems, 1–12.
Vancouver
1.
Nguyen Cong B, De Baets B. Kernel-Based Distance Metric Learning for Supervised k-Means Clustering. IEEE Transactions on Neural Networks and Learning Systems. Institute of Electrical and Electronics Engineers (IEEE); 2019;1–12.
MLA
Nguyen Cong, Bac, and Bernard De Baets. “Kernel-Based Distance Metric Learning for Supervised k-Means Clustering.” IEEE Transactions on Neural Networks and Learning Systems (2019): 1–12. Print.
@article{8589333,
  author       = {Nguyen Cong, Bac and De Baets, Bernard},
  issn         = {2162-237X},
  journal      = {IEEE Transactions on Neural Networks and Learning Systems},
  pages        = {1--12},
  publisher    = {Institute of Electrical and Electronics Engineers (IEEE)},
  title        = {Kernel-Based Distance Metric Learning for Supervised k-Means Clustering},
  url          = {http://dx.doi.org/10.1109/tnnls.2018.2890021},
  year         = {2019},
}

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