Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos
- Author
- Thomas Deckmyn, Marco Rossi (UGent) , Sam Agneessens (UGent) , Hendrik Rogier (UGent) and Dries Vande Ginste (UGent)
- Organization
- Abstract
- For the design and production of reliable devices applied in wearable components, characterization of the electromagnetic properties of materials is of paramount importance. Therefore, we propose a novel approach, based on a resonance-perturbation method, which compares simulations and performed measurements. An inset-fed patch antenna with a resonance frequency in the vicinity of the 2.45-GHz Industrial, Scientific, and Medical band enables us to quickly estimate the characteristics of a given material sample. In a first step, the two frequencies for which the simulated return loss of the fixture crosses a defined threshold are modeled as polynomial functions of the relative permittivity and loss tangent of the material under test. Then, the electromagnetic properties of the material are obtained by comparing the modeled and measured frequencies. The electromagnetic properties of several textile materials of interest are determined with this method. It is shown that the proposed technique is fast, precise, and nondestructive. Owing to this, it is suitable for integration into an assembly line, where substrate samples are straightforwardly characterized before being used for the manufacturing of actual antennas.
- Keywords
- textile antenna, substrate material characterization, Resonance perturbation method
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8588064
- MLA
- Deckmyn, Thomas, et al. “Assembly-Line-Compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications Using Polynomial Chaos.” 2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO), IEEE, 2018, pp. 1–4, doi:10.1109/nemo.2018.8503496.
- APA
- Deckmyn, T., Rossi, M., Agneessens, S., Rogier, H., & Vande Ginste, D. (2018). Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos. 2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO), 1–4. https://doi.org/10.1109/nemo.2018.8503496
- Chicago author-date
- Deckmyn, Thomas, Marco Rossi, Sam Agneessens, Hendrik Rogier, and Dries Vande Ginste. 2018. “Assembly-Line-Compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications Using Polynomial Chaos.” In 2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO), 1–4. IEEE. https://doi.org/10.1109/nemo.2018.8503496.
- Chicago author-date (all authors)
- Deckmyn, Thomas, Marco Rossi, Sam Agneessens, Hendrik Rogier, and Dries Vande Ginste. 2018. “Assembly-Line-Compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications Using Polynomial Chaos.” In 2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO), 1–4. IEEE. doi:10.1109/nemo.2018.8503496.
- Vancouver
- 1.Deckmyn T, Rossi M, Agneessens S, Rogier H, Vande Ginste D. Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos. In: 2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO). IEEE; 2018. p. 1–4.
- IEEE
- [1]T. Deckmyn, M. Rossi, S. Agneessens, H. Rogier, and D. Vande Ginste, “Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos,” in 2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO), Reykjavik, Iceland, 2018, pp. 1–4.
@inproceedings{8588064,
abstract = {{For the design and production of reliable devices applied in wearable components, characterization of the electromagnetic properties of materials is of paramount importance. Therefore, we propose a novel approach, based on a resonance-perturbation method, which compares simulations and performed measurements. An inset-fed patch antenna with a resonance frequency in the vicinity of the 2.45-GHz Industrial, Scientific, and Medical band enables us to quickly estimate the characteristics of a given material sample. In a first step, the two frequencies for which the simulated return loss of the fixture crosses a defined threshold are modeled as polynomial functions of the relative permittivity and loss tangent of the material under test. Then, the electromagnetic properties of the material are obtained by comparing the modeled and measured frequencies. The electromagnetic properties of several textile materials of interest are determined with this method. It is shown that the proposed technique is fast, precise, and nondestructive. Owing to this, it is suitable for integration into an assembly line, where substrate samples are straightforwardly characterized before being used for the manufacturing of actual antennas.}},
author = {{Deckmyn, Thomas and Rossi, Marco and Agneessens, Sam and Rogier, Hendrik and Vande Ginste, Dries}},
booktitle = {{2018 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO)}},
isbn = {{9781538652046}},
keywords = {{textile antenna,substrate material characterization,Resonance perturbation method}},
language = {{eng}},
location = {{Reykjavik, Iceland}},
pages = {{1--4}},
publisher = {{IEEE}},
title = {{Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos}},
url = {{http://doi.org/10.1109/nemo.2018.8503496}},
year = {{2018}},
}
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