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Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos

Thomas Deckmyn (UGent) , Marco Rossi (UGent) , Sam Agneessens (UGent) , Hendrik Rogier (UGent) and Dries Vande Ginste (UGent)
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MLA
Deckmyn, Thomas, Marco Rossi, Sam Agneessens, et al. “Assembly-line-compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications Using Polynomial Chaos.” 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO). IEEE, 2018. 1–4. Print.
APA
Deckmyn, T., Rossi, M., Agneessens, S., Rogier, H., & Vande Ginste, D. (2018). Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos. 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (pp. 1–4). Presented at the NEMO2018, IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization , IEEE.
Chicago author-date
Deckmyn, Thomas, Marco Rossi, Sam Agneessens, Hendrik Rogier, and Dries Vande Ginste. 2018. “Assembly-line-compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications Using Polynomial Chaos.” In 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), 1–4. IEEE.
Chicago author-date (all authors)
Deckmyn, Thomas, Marco Rossi, Sam Agneessens, Hendrik Rogier, and Dries Vande Ginste. 2018. “Assembly-line-compatible Electromagnetic Characterization of Antenna Substrates for Wearable Applications Using Polynomial Chaos.” In 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), 1–4. IEEE.
Vancouver
1.
Deckmyn T, Rossi M, Agneessens S, Rogier H, Vande Ginste D. Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos. 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO). IEEE; 2018. p. 1–4.
IEEE
[1]
T. Deckmyn, M. Rossi, S. Agneessens, H. Rogier, and D. Vande Ginste, “Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos,” in 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Reykjavik, Iceland, 2018, pp. 1–4.
@inproceedings{8588064,
  author       = {Deckmyn, Thomas and Rossi, Marco and Agneessens, Sam and Rogier, Hendrik and Vande Ginste, Dries},
  booktitle    = {2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)},
  isbn         = {9781538652046},
  language     = {eng},
  location     = {Reykjavik, Iceland},
  pages        = {1--4},
  publisher    = {IEEE},
  title        = {Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos},
  url          = {http://dx.doi.org/10.1109/nemo.2018.8503496},
  year         = {2018},
}

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