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Optical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer

(2018) CLEO 2018. p.1-2
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Center for nano- and biophotonics (NB-Photonics)

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Citation

Please use this url to cite or link to this publication:

MLA
Shi, Yuting, B. Kunert, M. Baryshnikova, et al. “Optical Gain Characterization of Nano-ridge Amplifiers Epitaxially on a Standard Si Wafer.” CLEO 2018. 2018. 1–2. Print.
APA
Shi, Yuting, Kunert, B., Baryshnikova, M., Pantouvaki, M., Van Campenhout, J., & Van Thourhout, D. (2018). Optical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer. CLEO 2018 (pp. 1–2). Presented at the CLEO 2018.
Chicago author-date
Shi, Yuting, B. Kunert, M. Baryshnikova, M. Pantouvaki, J. Van Campenhout, and Dries Van Thourhout. 2018. “Optical Gain Characterization of Nano-ridge Amplifiers Epitaxially on a Standard Si Wafer.” In CLEO 2018, 1–2.
Chicago author-date (all authors)
Shi, Yuting, B. Kunert, M. Baryshnikova, M. Pantouvaki, J. Van Campenhout, and Dries Van Thourhout. 2018. “Optical Gain Characterization of Nano-ridge Amplifiers Epitaxially on a Standard Si Wafer.” In CLEO 2018, 1–2.
Vancouver
1.
Shi Y, Kunert B, Baryshnikova M, Pantouvaki M, Van Campenhout J, Van Thourhout D. Optical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer. CLEO 2018. 2018. p. 1–2.
IEEE
[1]
Y. Shi, B. Kunert, M. Baryshnikova, M. Pantouvaki, J. Van Campenhout, and D. Van Thourhout, “Optical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer,” in CLEO 2018, San Jose, USA, 2018, pp. 1–2.
@inproceedings{8585009,
  articleno    = {JTu2A.21},
  author       = {Shi, Yuting and Kunert, B. and Baryshnikova, M. and Pantouvaki, M. and Van Campenhout, J. and Van Thourhout, Dries},
  booktitle    = {CLEO 2018},
  isbn         = { 978-1-943580-42-2},
  language     = {eng},
  location     = {San Jose, USA},
  pages        = {JTu2A.21:1--JTu2A.21:2},
  title        = {Optical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer},
  year         = {2018},
}