On the origin of the leakage current in p-gate AlGaN/GaN HEMTs
- Author
- Arno Stockman, E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens and Benoit Bakeroot (UGent)
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Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8583747
- MLA
- Stockman, Arno, et al. “On the Origin of the Leakage Current in P-Gate AlGaN/GaN HEMTs.” 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), IEEE, 2018, p. 4B.5-1-4B.5-4, doi:10.1109/irps.2018.8353582.
- APA
- Stockman, A., Canato, E., Tajalli, A., Meneghini, M., Meneghesso, G., Zanoni, E., … Bakeroot, B. (2018). On the origin of the leakage current in p-gate AlGaN/GaN HEMTs. 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 4B.5-1-4B.5-4. https://doi.org/10.1109/irps.2018.8353582
- Chicago author-date
- Stockman, Arno, E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens, and Benoit Bakeroot. 2018. “On the Origin of the Leakage Current in P-Gate AlGaN/GaN HEMTs.” In 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 4B.5-1-4B.5-4. IEEE. https://doi.org/10.1109/irps.2018.8353582.
- Chicago author-date (all authors)
- Stockman, Arno, E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens, and Benoit Bakeroot. 2018. “On the Origin of the Leakage Current in P-Gate AlGaN/GaN HEMTs.” In 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 4B.5-1-4B.5-4. IEEE. doi:10.1109/irps.2018.8353582.
- Vancouver
- 1.Stockman A, Canato E, Tajalli A, Meneghini M, Meneghesso G, Zanoni E, et al. On the origin of the leakage current in p-gate AlGaN/GaN HEMTs. In: 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). IEEE; 2018. p. 4B.5-1-4B.5-4.
- IEEE
- [1]A. Stockman et al., “On the origin of the leakage current in p-gate AlGaN/GaN HEMTs,” in 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), Burlingame, CA, 2018, p. 4B.5-1-4B.5-4.
@inproceedings{8583747,
author = {{Stockman, Arno and Canato, E. and Tajalli, A. and Meneghini, M. and Meneghesso, G. and Zanoni, E. and Moens, P. and Bakeroot, Benoit}},
booktitle = {{2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)}},
isbn = {{9781538654798}},
issn = {{1541-7026}},
language = {{eng}},
location = {{Burlingame, CA}},
pages = {{4B.5-1--4B.5-4}},
publisher = {{IEEE}},
title = {{On the origin of the leakage current in p-gate AlGaN/GaN HEMTs}},
url = {{http://doi.org/10.1109/irps.2018.8353582}},
year = {{2018}},
}
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