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Full-field spectral measurement of a synchrotron beam after a multi-layer monochromator using a hyperspectral X-ray camera

(2018) MICROSCOPY AND MICROANALYSIS. 24(suppl. 2). p.324-325
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Citation

Please use this url to cite or link to this publication:

Chicago
Boone, Matthieu, Frederic Van Assche, Sander Vanheule, Silvia Cipiccia, Hongchang Wang, Laszlo Vincze, and Luc Van Hoorebeke. 2018. “Full-field Spectral Measurement of a Synchrotron Beam After a Multi-layer Monochromator Using a Hyperspectral X-ray Camera.” In Microscopy and Microanalysis, 24:324–325.
APA
Boone, M., Van Assche, F., Vanheule, S., Cipiccia, S., Wang, H., Vincze, L., & Van Hoorebeke, L. (2018). Full-field spectral measurement of a synchrotron beam after a multi-layer monochromator using a hyperspectral X-ray camera. MICROSCOPY AND MICROANALYSIS (Vol. 24, pp. 324–325). Presented at the 14th International conference on X-ray Microscopy (XRM-2018).
Vancouver
1.
Boone M, Van Assche F, Vanheule S, Cipiccia S, Wang H, Vincze L, et al. Full-field spectral measurement of a synchrotron beam after a multi-layer monochromator using a hyperspectral X-ray camera. MICROSCOPY AND MICROANALYSIS. 2018. p. 324–5.
MLA
Boone, Matthieu et al. “Full-field Spectral Measurement of a Synchrotron Beam After a Multi-layer Monochromator Using a Hyperspectral X-ray Camera.” Microscopy and Microanalysis. Vol. 24. 2018. 324–325. Print.
@inproceedings{8583742,
  author       = {Boone, Matthieu and Van Assche, Frederic and Vanheule, Sander and Cipiccia, Silvia and Wang, Hongchang and Vincze, Laszlo and Van Hoorebeke, Luc},
  booktitle    = {MICROSCOPY AND MICROANALYSIS},
  issn         = {1431-9276},
  language     = {eng},
  location     = {Saskatoon, SK, Canada},
  number       = {suppl. 2},
  pages        = {324--325},
  title        = {Full-field spectral measurement of a synchrotron beam after a multi-layer monochromator using a hyperspectral X-ray camera},
  url          = {http://dx.doi.org/10.1017/s1431927618013946},
  volume       = {24},
  year         = {2018},
}

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