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4π microscopy immune to sample-induced dephasing

Alejandro Diaz Tormo (UGent) , Dmitry Khalenkow (UGent) , Andre Skirtach (UGent) and Nicolas Le Thomas (UGent)
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Center for nano- and biophotonics (NB-Photonics)

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Citation

Please use this url to cite or link to this publication:

Chicago
Diaz Tormo, Alejandro, Dmitry Khalenkow, Andre Skirtach, and Nicolas Le Thomas. 2018. “4π Microscopy Immune to Sample-induced Dephasing.” In 2018 IEEE Photonics Conference (IPC), 259–260. New York, NY, USA: IEEE.
APA
Diaz Tormo, A., Khalenkow, D., Skirtach, A., & Le Thomas, N. (2018). 4π microscopy immune to sample-induced dephasing. 2018 IEEE photonics conference (IPC) (pp. 259–260). Presented at the 2018 IEEE Photonics conference (IPC-2018), New York, NY, USA: IEEE.
Vancouver
1.
Diaz Tormo A, Khalenkow D, Skirtach A, Le Thomas N. 4π microscopy immune to sample-induced dephasing. 2018 IEEE photonics conference (IPC). New York, NY, USA: IEEE; 2018. p. 259–60.
MLA
Diaz Tormo, Alejandro, Dmitry Khalenkow, Andre Skirtach, et al. “4π Microscopy Immune to Sample-induced Dephasing.” 2018 IEEE Photonics Conference (IPC). New York, NY, USA: IEEE, 2018. 259–260. Print.
@inproceedings{8582812,
  author       = {Diaz Tormo, Alejandro and Khalenkow, Dmitry and Skirtach, Andre and Le Thomas, Nicolas},
  booktitle    = {2018 IEEE photonics conference (IPC)},
  isbn         = {9781538640821},
  language     = {eng},
  location     = {Reston, VA, USA},
  pages        = {259--260},
  publisher    = {IEEE},
  title        = {4\ensuremath{\pi} microscopy immune to sample-induced dephasing},
  url          = {http://dx.doi.org/10.1109/IPCon.2018.8527189},
  year         = {2018},
}

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