Advanced search
2 files | 3.16 MB

From parameter extraction, variability models to yield prediction

Yufei Xing (UGent) , Jiaxing Dong, Umar Khan (UGent) , Yinghao Ye (UGent) , Domenico Spina (UGent) , Tom Dhaene (UGent) and Wim Bogaerts (UGent)
Author
Organization
Project
Center for nano- and biophotonics (NB-Photonics)
Project
Scalable behavioral models for large-scale silicon photonics

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 1.55 MB
  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 1.61 MB

Citation

Please use this url to cite or link to this publication:

Chicago
Xing, Yufei, Jiaxing Dong, Umar Khan, Yinghao Ye, Domenico Spina, Tom Dhaene, and Wim Bogaerts. 2018. “From Parameter Extraction, Variability Models to Yield Prediction.” In Latin America Optics and Photonics Conference 2018.
APA
Xing, Y., Dong, J., Khan, U., Ye, Y., Spina, D., Dhaene, T., & Bogaerts, W. (2018). From parameter extraction, variability models to yield prediction. Latin America Optics and Photonics conference 2018. Presented at the Latin America Optics and Photonics .
Vancouver
1.
Xing Y, Dong J, Khan U, Ye Y, Spina D, Dhaene T, et al. From parameter extraction, variability models to yield prediction. Latin America Optics and Photonics conference 2018. 2018.
MLA
Xing, Yufei et al. “From Parameter Extraction, Variability Models to Yield Prediction.” Latin America Optics and Photonics Conference 2018. 2018. Print.
@inproceedings{8581808,
  articleno    = {paper W3E.1 },
  author       = {Xing, Yufei and Dong, Jiaxing and Khan, Umar and Ye, Yinghao and Spina, Domenico and Dhaene, Tom and Bogaerts, Wim},
  booktitle    = {Latin America Optics and Photonics conference 2018},
  isbn         = {9781943580491},
  language     = {eng},
  location     = {Lima, Peru},
  pages        = {3},
  title        = {From parameter extraction, variability models to yield prediction},
  year         = {2018},
}