Characterization of the exposure due to smart-home devices and other residential RF sources
- Author
- Sam Aerts (UGent) , Leen Verloock (UGent) , Matthias Van den Bossche (UGent) , Ximena Vergara, Luc Martens (UGent) and Wout Joseph (UGent)
- Organization
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8578231
- MLA
- Aerts, Sam, et al. “Characterization of the Exposure Due to Smart-Home Devices and Other Residential RF Sources.” Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association, 2018, pp. 286–90.
- APA
- Aerts, S., Verloock, L., Van den Bossche, M., Vergara, X., Martens, L., & Joseph, W. (2018). Characterization of the exposure due to smart-home devices and other residential RF sources. Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association, 286–290.
- Chicago author-date
- Aerts, Sam, Leen Verloock, Matthias Van den Bossche, Ximena Vergara, Luc Martens, and Wout Joseph. 2018. “Characterization of the Exposure Due to Smart-Home Devices and Other Residential RF Sources.” In Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association, 286–90.
- Chicago author-date (all authors)
- Aerts, Sam, Leen Verloock, Matthias Van den Bossche, Ximena Vergara, Luc Martens, and Wout Joseph. 2018. “Characterization of the Exposure Due to Smart-Home Devices and Other Residential RF Sources.” In Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association, 286–290.
- Vancouver
- 1.Aerts S, Verloock L, Van den Bossche M, Vergara X, Martens L, Joseph W. Characterization of the exposure due to smart-home devices and other residential RF sources. In: Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association. 2018. p. 286–90.
- IEEE
- [1]S. Aerts, L. Verloock, M. Van den Bossche, X. Vergara, L. Martens, and W. Joseph, “Characterization of the exposure due to smart-home devices and other residential RF sources,” in Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association, Piran, Portorož, Slovenia, 2018, pp. 286–290.
@inproceedings{8578231, author = {{Aerts, Sam and Verloock, Leen and Van den Bossche, Matthias and Vergara, Ximena and Martens, Luc and Joseph, Wout}}, booktitle = {{Proceedings of the Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association}}, isbn = {{978-1-5108-7133-5}}, language = {{eng}}, location = {{Piran, Portorož, Slovenia}}, pages = {{286--290}}, title = {{Characterization of the exposure due to smart-home devices and other residential RF sources}}, year = {{2018}}, }