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Discriminating defects and device responses in capacitance spectroscopic methods

Sheng Yang (UGent) , Johan Lauwaert (UGent) , Samira Khelifi (UGent) , Henk Vrielinck (UGent) , Ana Obradović (UGent) , Jeroen Lauwaert (UGent) and Joris Thybaut (UGent)
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MLA
Yang, Sheng, Johan Lauwaert, Samira Khelifi, et al. “Discriminating Defects and Device Responses in Capacitance Spectroscopic Methods.” Reliable and Quantitative Prediction of Defect Properties in Ga-based Semiconductors, CECAM Workshop Abstracts. 2018. Print.
APA
Yang, Sheng, Lauwaert, J., Khelifi, S., Vrielinck, H., Obradović, A., Lauwaert, J., & Thybaut, J. (2018). Discriminating defects and device responses in capacitance spectroscopic methods. Reliable and quantitative prediction of defect properties in Ga-based semiconductors, CECAM workshop abstracts. Presented at the CECAM workshop on Reliable and quantitative prediction of defect properties in Ga-based semiconductors (CECAM).
Chicago author-date
Yang, Sheng, Johan Lauwaert, Samira Khelifi, Henk Vrielinck, Ana Obradović, Jeroen Lauwaert, and Joris Thybaut. 2018. “Discriminating Defects and Device Responses in Capacitance Spectroscopic Methods.” In Reliable and Quantitative Prediction of Defect Properties in Ga-based Semiconductors, CECAM Workshop Abstracts.
Chicago author-date (all authors)
Yang, Sheng, Johan Lauwaert, Samira Khelifi, Henk Vrielinck, Ana Obradović, Jeroen Lauwaert, and Joris Thybaut. 2018. “Discriminating Defects and Device Responses in Capacitance Spectroscopic Methods.” In Reliable and Quantitative Prediction of Defect Properties in Ga-based Semiconductors, CECAM Workshop Abstracts.
Vancouver
1.
Yang S, Lauwaert J, Khelifi S, Vrielinck H, Obradović A, Lauwaert J, et al. Discriminating defects and device responses in capacitance spectroscopic methods. Reliable and quantitative prediction of defect properties in Ga-based semiconductors, CECAM workshop abstracts. 2018.
IEEE
[1]
S. Yang et al., “Discriminating defects and device responses in capacitance spectroscopic methods,” in Reliable and quantitative prediction of defect properties in Ga-based semiconductors, CECAM workshop abstracts, Bremen, Germany, 2018.
@inproceedings{8577186,
  author       = {Yang, Sheng and Lauwaert, Johan and Khelifi, Samira and Vrielinck, Henk and Obradović, Ana and Lauwaert, Jeroen and Thybaut, Joris},
  booktitle    = {Reliable and quantitative prediction of defect properties in Ga-based semiconductors, CECAM workshop abstracts},
  language     = {eng},
  location     = {Bremen, Germany},
  title        = {Discriminating defects and device responses in capacitance spectroscopic methods},
  year         = {2018},
}