A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length
- Author
- Jasper Beernaerts (UGent) , Ellen Debever (UGent) , Matthieu Lenoir (UGent) , Bernard De Baets (UGent) and Nico Van de Weghe (UGent)
- Organization
- Keywords
- Moving objects, Qualitative Trajectory Calculus (QTC), Similarity analysis, Spatiotemporal modelling, REPRESENTING MOVING-OBJECTS, ALIGNMENT, SYSTEMS, TRAJECTORIES, INFORMATION, SIMILARITY, CALCULUS, DIAGRAMS, SPACE, TIME
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8571912
- MLA
- Beernaerts, Jasper, et al. “A Method Based on the Levenshtein Distance Metric for the Comparison of Multiple Movement Patterns Described by Matrix Sequences of Different Length.” EXPERT SYSTEMS WITH APPLICATIONS, vol. 115, 2019, pp. 373–85, doi:10.1016/j.eswa.2018.07.076.
- APA
- Beernaerts, J., Debever, E., Lenoir, M., De Baets, B., & Van de Weghe, N. (2019). A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length. EXPERT SYSTEMS WITH APPLICATIONS, 115, 373–385. https://doi.org/10.1016/j.eswa.2018.07.076
- Chicago author-date
- Beernaerts, Jasper, Ellen Debever, Matthieu Lenoir, Bernard De Baets, and Nico Van de Weghe. 2019. “A Method Based on the Levenshtein Distance Metric for the Comparison of Multiple Movement Patterns Described by Matrix Sequences of Different Length.” EXPERT SYSTEMS WITH APPLICATIONS 115: 373–85. https://doi.org/10.1016/j.eswa.2018.07.076.
- Chicago author-date (all authors)
- Beernaerts, Jasper, Ellen Debever, Matthieu Lenoir, Bernard De Baets, and Nico Van de Weghe. 2019. “A Method Based on the Levenshtein Distance Metric for the Comparison of Multiple Movement Patterns Described by Matrix Sequences of Different Length.” EXPERT SYSTEMS WITH APPLICATIONS 115: 373–385. doi:10.1016/j.eswa.2018.07.076.
- Vancouver
- 1.Beernaerts J, Debever E, Lenoir M, De Baets B, Van de Weghe N. A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length. EXPERT SYSTEMS WITH APPLICATIONS. 2019;115:373–85.
- IEEE
- [1]J. Beernaerts, E. Debever, M. Lenoir, B. De Baets, and N. Van de Weghe, “A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length,” EXPERT SYSTEMS WITH APPLICATIONS, vol. 115, pp. 373–385, 2019.
@article{8571912,
author = {{Beernaerts, Jasper and Debever, Ellen and Lenoir, Matthieu and De Baets, Bernard and Van de Weghe, Nico}},
issn = {{0957-4174}},
journal = {{EXPERT SYSTEMS WITH APPLICATIONS}},
keywords = {{Moving objects,Qualitative Trajectory Calculus (QTC),Similarity analysis,Spatiotemporal modelling,REPRESENTING MOVING-OBJECTS,ALIGNMENT,SYSTEMS,TRAJECTORIES,INFORMATION,SIMILARITY,CALCULUS,DIAGRAMS,SPACE,TIME}},
language = {{eng}},
pages = {{373--385}},
title = {{A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length}},
url = {{http://doi.org/10.1016/j.eswa.2018.07.076}},
volume = {{115}},
year = {{2019}},
}
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