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A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length

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Chicago
Beernaerts, Jasper, Ellen Debever, Matthieu Lenoir, Bernard De Baets, and Nico Van de Weghe. 2019. “A Method Based on the Levenshtein Distance Metric for the Comparison of Multiple Movement Patterns Described by Matrix Sequences of Different Length.” Expert Systems with Applications 115: 373–385.
APA
Beernaerts, J., Debever, E., Lenoir, M., De Baets, B., & Van de Weghe, N. (2019). A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length. Expert Systems with Applications, 115, 373–385.
Vancouver
1.
Beernaerts J, Debever E, Lenoir M, De Baets B, Van de Weghe N. A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length. Expert Systems with Applications. Elsevier BV; 2019;115:373–85.
MLA
Beernaerts, Jasper, Ellen Debever, Matthieu Lenoir, et al. “A Method Based on the Levenshtein Distance Metric for the Comparison of Multiple Movement Patterns Described by Matrix Sequences of Different Length.” Expert Systems with Applications 115 (2019): 373–385. Print.
@article{8571912,
  author       = {Beernaerts, Jasper and Debever, Ellen and Lenoir, Matthieu and De Baets, Bernard and Van~de~Weghe, Nico},
  issn         = {0957-4174},
  journal      = {Expert Systems with Applications},
  pages        = {373--385},
  publisher    = {Elsevier BV},
  title        = {A method based on the Levenshtein distance metric for the comparison of multiple movement patterns described by matrix sequences of different length},
  url          = {http://dx.doi.org/10.1016/j.eswa.2018.07.076},
  volume       = {115},
  year         = {2019},
}

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