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An overview of state-of-the-art image restoration in electron microscopy

Joris Roels (UGent) , Jan Aelterman (UGent) , Hiep Luong (UGent) , Saskia Lippens (UGent) , Aleksandra Pizurica (UGent) , Yvan Saeys (UGent) and Wilfried Philips (UGent)
(2018) JOURNAL OF MICROSCOPY. 271(3). p.239-254
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Abstract
In Life Science research, electron microscopy (EM) is an essential tool for morphological analysis at the subcellular level as it allows for visualization at nanometer resolution. However, electron micrographs contain image degradations such as noise and blur caused by electromagnetic interference, electron counting errors, magnetic lens imperfections, electron diffraction, etc. These imperfections in raw image quality are inevitable and hamper subsequent image analysis and visualization. In an effort to mitigate these artefacts, many electron microscopy image restoration algorithms have been proposed in the last years. Most of these methods rely on generic assumptions on the image or degradations and are therefore outperformed by advanced methods that are based on more accurate models. Ideally, a method will accurately model the specific degradations that fit the physical acquisition settings. In this overview paper, we discuss different electron microscopy image degradation solutions and demonstrate that dedicated artefact regularisation results in higher quality restoration and is applicable through recently developed probabilistic methods.
Keywords
Deconvolution, denoising, electron microscopy, image restoration, DENOISING FILTER, FREQUENCY LOCALIZATION, ANISOTROPIC DIFFUSION, DECONVOLUTION, REPRESENTATION, TRANSFORM, ALGORITHM, DECOMPOSITION, MIXTURES, DOMAIN

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Chicago
Roels, Joris, Jan Aelterman, Hiep Luong, Saskia Lippens, Aleksandra Pizurica, Yvan Saeys, and Wilfried Philips. 2018. “An Overview of State-of-the-art Image Restoration in Electron Microscopy.” Journal of Microscopy 271 (3): 239–254.
APA
Roels, Joris, Aelterman, J., Luong, H., Lippens, S., Pizurica, A., Saeys, Y., & Philips, W. (2018). An overview of state-of-the-art image restoration in electron microscopy. JOURNAL OF MICROSCOPY, 271(3), 239–254.
Vancouver
1.
Roels J, Aelterman J, Luong H, Lippens S, Pizurica A, Saeys Y, et al. An overview of state-of-the-art image restoration in electron microscopy. JOURNAL OF MICROSCOPY. 2018;271(3):239–54.
MLA
Roels, Joris, Jan Aelterman, Hiep Luong, et al. “An Overview of State-of-the-art Image Restoration in Electron Microscopy.” JOURNAL OF MICROSCOPY 271.3 (2018): 239–254. Print.
@article{8565917,
  abstract     = {In Life Science research, electron microscopy (EM) is an essential tool for morphological analysis at the subcellular level as it allows for visualization at nanometer resolution. However, electron micrographs contain image degradations such as noise and blur caused by electromagnetic interference, electron counting errors, magnetic lens imperfections, electron diffraction, etc. These imperfections in raw image quality are inevitable and hamper subsequent image analysis and visualization. In an effort to mitigate these artefacts, many electron microscopy image restoration algorithms have been proposed in the last years. Most of these methods rely on generic assumptions on the image or degradations and are therefore outperformed by advanced methods that are based on more accurate models. Ideally, a method will accurately model the specific degradations that fit the physical acquisition settings. In this overview paper, we discuss different electron microscopy image degradation solutions and demonstrate that dedicated artefact regularisation results in higher quality restoration and is applicable through recently developed probabilistic methods.},
  author       = {Roels, Joris and Aelterman, Jan and Luong, Hiep and Lippens, Saskia and Pizurica, Aleksandra and Saeys, Yvan and Philips, Wilfried},
  issn         = {0022-2720},
  journal      = {JOURNAL OF MICROSCOPY},
  language     = {eng},
  number       = {3},
  pages        = {239--254},
  title        = {An overview of state-of-the-art image restoration in electron microscopy},
  url          = {http://dx.doi.org/10.1111/jmi.12716},
  volume       = {271},
  year         = {2018},
}

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