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Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits

Niels Lambrecht (UGent)
(2018)
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(UGent) and (UGent)
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MLA
Lambrecht, Niels. Modeling of Complex EMC Test Setups for the Assessment of the Transient Behavior of Automotive Integrated Circuits. Ghent University. Faculty of Engineering and Architecture, 2018.
APA
Lambrecht, N. (2018). Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits. Ghent University. Faculty of Engineering and Architecture, Ghent, Belgium.
Chicago author-date
Lambrecht, Niels. 2018. “Modeling of Complex EMC Test Setups for the Assessment of the Transient Behavior of Automotive Integrated Circuits.” Ghent, Belgium: Ghent University. Faculty of Engineering and Architecture.
Chicago author-date (all authors)
Lambrecht, Niels. 2018. “Modeling of Complex EMC Test Setups for the Assessment of the Transient Behavior of Automotive Integrated Circuits.” Ghent, Belgium: Ghent University. Faculty of Engineering and Architecture.
Vancouver
1.
Lambrecht N. Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits. [Ghent, Belgium]: Ghent University. Faculty of Engineering and Architecture; 2018.
IEEE
[1]
N. Lambrecht, “Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits,” Ghent University. Faculty of Engineering and Architecture, Ghent, Belgium, 2018.
@phdthesis{8561036,
  author       = {{Lambrecht, Niels}},
  isbn         = {{9789463551106}},
  language     = {{eng}},
  pages        = {{XIII, 102}},
  publisher    = {{Ghent University. Faculty of Engineering and Architecture}},
  school       = {{Ghent University}},
  title        = {{Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits}},
  year         = {{2018}},
}