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Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits

Niels Lambrecht UGent (2018)
Please use this url to cite or link to this publication:
author
promoter
UGent and UGent
organization
alternative title
Modellering van complexe EMC-testopstellingen voor de transiëntanalyse van geïntegreerde schakelingen in de automobielindustrie
year
type
dissertation
publication status
published
defense location
Ghent
defense date
2018-04-30 17:00
ISBN
978-94-6355-110-6
language
English
UGent publication?
yes
classification
D1
id
8561036
handle
http://hdl.handle.net/1854/LU-8561036
date created
2018-05-07 07:04:44
date last changed
2018-06-12 13:58:39
@phdthesis{8561036,
  author       = {Lambrecht, Niels},
  isbn         = {978-94-6355-110-6},
  language     = {eng},
  school       = {Ghent University},
  title        = {Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits},
  year         = {2018},
}

Chicago
Lambrecht, Niels. 2018. “Modeling of Complex EMC Test Setups for the Assessment of the Transient Behavior of Automotive Integrated Circuits.”
APA
Lambrecht, N. (2018). Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits.
Vancouver
1.
Lambrecht N. Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits. 2018.
MLA
Lambrecht, Niels. “Modeling of Complex EMC Test Setups for the Assessment of the Transient Behavior of Automotive Integrated Circuits.” 2018 : n. pag. Print.