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Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic R-on

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Citation

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Chicago
Stockman, Arno, Michael Uren, Alaleh Tajalli, Matteo Meneghini, Benoit Bakeroot, and Peter Moens. 2017. “Temperature Dependent Substrate Trapping in AlGaN/GaN Power Devices and the Impact on Dynamic R-on.” In 2017 47TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC), 130–133. 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE.
APA
Stockman, Arno, Uren, M., Tajalli, A., Meneghini, M., Bakeroot, B., & Moens, P. (2017). Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic R-on. 2017 47TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC) (pp. 130–133). Presented at the 47th European Solid-State Device Research Conference (ESSDERC) , 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE.
Vancouver
1.
Stockman A, Uren M, Tajalli A, Meneghini M, Bakeroot B, Moens P. Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic R-on. 2017 47TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC). 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE; 2017. p. 130–3.
MLA
Stockman, Arno, Michael Uren, Alaleh Tajalli, et al. “Temperature Dependent Substrate Trapping in AlGaN/GaN Power Devices and the Impact on Dynamic R-on.” 2017 47TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC). 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE, 2017. 130–133. Print.
@inproceedings{8558747,
  author       = {Stockman, Arno and Uren, Michael and Tajalli, Alaleh and Meneghini, Matteo and Bakeroot, Benoit and Moens, Peter},
  booktitle    = {2017 47TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC)},
  isbn         = {1930-8876},
  issn         = {978-1-5090-5978-2},
  language     = {eng},
  location     = {Leuven, BELGIUM},
  pages        = {130--133},
  publisher    = {IEEE},
  title        = {Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic R-on},
  year         = {2017},
}

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