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Study of electron traps associated with oxygen superlattices in n‐type silicon

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MLA
Simoen, Eddy, et al. “Study of Electron Traps Associated with Oxygen Superlattices in N‐type Silicon.” PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS, vol. 14, no. 12, 2017.
APA
Simoen, E., Jayachandran, S., Delabie, A., Caymax, M., & Heyns, M. (2017). Study of electron traps associated with oxygen superlattices in n‐type silicon. In PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS (Vol. 14). Strasbourg, France.
Chicago author-date
Simoen, Eddy, Suseendran Jayachandran, Annelies Delabie, Matty Caymax, and Marc Heyns. 2017. “Study of Electron Traps Associated with Oxygen Superlattices in N‐type Silicon.” In PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS. Vol. 14.
Chicago author-date (all authors)
Simoen, Eddy, Suseendran Jayachandran, Annelies Delabie, Matty Caymax, and Marc Heyns. 2017. “Study of Electron Traps Associated with Oxygen Superlattices in N‐type Silicon.” In PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS. Vol. 14.
Vancouver
1.
Simoen E, Jayachandran S, Delabie A, Caymax M, Heyns M. Study of electron traps associated with oxygen superlattices in n‐type silicon. In: PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS. 2017.
IEEE
[1]
E. Simoen, S. Jayachandran, A. Delabie, M. Caymax, and M. Heyns, “Study of electron traps associated with oxygen superlattices in n‐type silicon,” in PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS, Strasbourg, France, 2017, vol. 14, no. 12.
@inproceedings{8557675,
  articleno    = {{1700136}},
  author       = {{Simoen, Eddy and Jayachandran, Suseendran and Delabie, Annelies and Caymax, Matty and Heyns, Marc}},
  booktitle    = {{PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS}},
  issn         = {{1862-6351}},
  language     = {{eng}},
  location     = {{Strasbourg, France}},
  number       = {{12}},
  pages        = {{5}},
  title        = {{Study of electron traps associated with oxygen superlattices in n‐type silicon}},
  url          = {{http://dx.doi.org/10.1002/pssc.201700136}},
  volume       = {{14}},
  year         = {{2017}},
}

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