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Exploiting Reflectional and Rotational Invariance in Single Image Superresolution

Simon Donné UGent, Laurens Meeus UGent, Hiep Luong UGent, Bart Goossens UGent and Wilfried Philips UGent (2017)
Please use this url to cite or link to this publication:
author
organization
year
type
conference (meetingAbstract)
publication status
published
publisher
IEEE
conference name
Computer Vision and Pattern Recognition, CVPR 2017
conference organizer
IEEE
conference location
Honolulu, Hawaii
ISBN
9781538607336
DOI
10.1109/cvprw.2017.141
language
English
UGent publication?
yes
classification
C3
id
8538773
handle
http://hdl.handle.net/1854/LU-8538773
date created
2017-11-23 12:33:07
date last changed
2017-12-04 07:49:10
@inproceedings{8538773,
  author       = {Donn{\'e}, Simon and Meeus, Laurens and Luong, Hiep and Goossens, Bart and Philips, Wilfried},
  isbn         = {9781538607336},
  language     = {eng},
  location     = {Honolulu, Hawaii},
  publisher    = {IEEE},
  title        = {Exploiting Reflectional and Rotational Invariance in Single Image Superresolution},
  url          = {http://dx.doi.org/10.1109/cvprw.2017.141},
  year         = {2017},
}

Chicago
Donné, Simon, Laurens Meeus, Hiep Luong, Bart Goossens, and Wilfried Philips. 2017. “Exploiting Reflectional and Rotational Invariance in Single Image Superresolution.” In IEEE.
APA
Donné, S., Meeus, L., Luong, H., Goossens, B., & Philips, W. (2017). Exploiting Reflectional and Rotational Invariance in Single Image Superresolution. Presented at the Computer Vision and Pattern Recognition, CVPR 2017, IEEE.
Vancouver
1.
Donné S, Meeus L, Luong H, Goossens B, Philips W. Exploiting Reflectional and Rotational Invariance in Single Image Superresolution. IEEE; 2017.
MLA
Donné, Simon, Laurens Meeus, Hiep Luong, et al. “Exploiting Reflectional and Rotational Invariance in Single Image Superresolution.” IEEE, 2017. Print.