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Distance metric learning with the Universum

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Keywords
Metric learning, Universum learning, Nearest neighbor, NONLINEAR DIMENSIONALITY REDUCTION, CLASSIFICATION, MACHINE

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Citation

Please use this url to cite or link to this publication:

MLA
Nguyen Cong, Bac, Carlos Morell, and Bernard De Baets. “Distance Metric Learning with the Universum.” PATTERN RECOGNITION LETTERS 100 (2017): 37–43. Print.
APA
Nguyen Cong, B., Morell, C., & De Baets, B. (2017). Distance metric learning with the Universum. PATTERN RECOGNITION LETTERS, 100, 37–43.
Chicago author-date
Nguyen Cong, Bac, Carlos Morell, and Bernard De Baets. 2017. “Distance Metric Learning with the Universum.” Pattern Recognition Letters 100: 37–43.
Chicago author-date (all authors)
Nguyen Cong, Bac, Carlos Morell, and Bernard De Baets. 2017. “Distance Metric Learning with the Universum.” Pattern Recognition Letters 100: 37–43.
Vancouver
1.
Nguyen Cong B, Morell C, De Baets B. Distance metric learning with the Universum. PATTERN RECOGNITION LETTERS. 2017;100:37–43.
IEEE
[1]
B. Nguyen Cong, C. Morell, and B. De Baets, “Distance metric learning with the Universum,” PATTERN RECOGNITION LETTERS, vol. 100, pp. 37–43, 2017.
@article{8535719,
  author       = {Nguyen Cong, Bac and Morell, Carlos and De Baets, Bernard},
  issn         = {0167-8655},
  journal      = {PATTERN RECOGNITION LETTERS},
  keywords     = {Metric learning,Universum learning,Nearest neighbor,NONLINEAR DIMENSIONALITY REDUCTION,CLASSIFICATION,MACHINE},
  language     = {eng},
  pages        = {37--43},
  title        = {Distance metric learning with the Universum},
  url          = {http://dx.doi.org/10.1016/j.patrec.2017.09.031},
  volume       = {100},
  year         = {2017},
}

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