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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

(2017) p.1-5
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Citation

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Chicago
Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, and H. Pues. 2017. “Modeling Transient Electrical Disturbances by Inductive Coupling for the ISO 7637-3 ICC Test.” In , 1–5.
APA
Lambrecht, N., De Zutter, D., Vande Ginste, D., & Pues, H. (2017). Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test (pp. 1–5). Presented at the EMC EUROPE 2017, the 2017 International Symposium on Electromagnetic Compatibility.
Vancouver
1.
Lambrecht N, De Zutter D, Vande Ginste D, Pues H. Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test. 2017. p. 1–5.
MLA
Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, et al. “Modeling Transient Electrical Disturbances by Inductive Coupling for the ISO 7637-3 ICC Test.” 2017. 1–5. Print.
@inproceedings{8534397,
  author       = {Lambrecht, Niels and De Zutter, Dani{\"e}l and Vande Ginste, Dries and Pues, H.},
  isbn         = {978-1-5386-0689-6},
  keyword      = {IBCN},
  language     = {eng},
  location     = {Angers, France},
  pages        = {1--5},
  title        = {Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test},
  year         = {2017},
}