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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Niels Lambrecht UGent, Daniël De Zutter UGent, Dries Vande Ginste UGent and H. Pues (2017) p.1-5
Please use this url to cite or link to this publication:
author
organization
year
type
conference (other)
publication status
published
keyword
IBCN
pages
1 - 5
conference name
EMC EUROPE 2017, the 2017 International Symposium on Electromagnetic Compatibility
conference location
Angers, France
conference start
2017-09-04
conference end
2017-09-08
ISBN
978-1-5386-0689-6
language
English
UGent publication?
yes
classification
C1
id
8534397
handle
http://hdl.handle.net/1854/LU-8534397
date created
2017-10-16 09:25:47
date last changed
2018-05-15 12:32:36
@inproceedings{8534397,
  author       = {Lambrecht, Niels and De Zutter, Dani{\"e}l and Vande Ginste, Dries and Pues, H.},
  isbn         = {978-1-5386-0689-6},
  keyword      = {IBCN},
  language     = {eng},
  location     = {Angers, France},
  pages        = {1--5},
  title        = {Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test},
  year         = {2017},
}

Chicago
Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, and H. Pues. 2017. “Modeling Transient Electrical Disturbances by Inductive Coupling for the ISO 7637-3 ICC Test.” In , 1–5.
APA
Lambrecht, N., De Zutter, D., Vande Ginste, D., & Pues, H. (2017). Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test (pp. 1–5). Presented at the EMC EUROPE 2017, the 2017 International Symposium on Electromagnetic Compatibility.
Vancouver
1.
Lambrecht N, De Zutter D, Vande Ginste D, Pues H. Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test. 2017. p. 1–5.
MLA
Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, et al. “Modeling Transient Electrical Disturbances by Inductive Coupling for the ISO 7637-3 ICC Test.” 2017. 1–5. Print.