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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust

(2017) p.141-145
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Citation

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Chicago
Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, and H. Pues. 2017. “Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust.” In , 141–145.
APA
Lambrecht, N., De Zutter, D., Vande Ginste, D., & Pues, H. (2017). Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust (pp. 141–145). Presented at the EMCCompo2017, the 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits.
Vancouver
1.
Lambrecht N, De Zutter D, Vande Ginste D, Pues H. Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust. 2017. p. 141–5.
MLA
Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, et al. “Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust.” 2017. 141–145. Print.
@inproceedings{8534391,
  author       = {Lambrecht, Niels and De Zutter, Dani{\"e}l and Vande Ginste, Dries and Pues, H. },
  isbn         = {978-1-5386-2689-4},
  keyword      = {IBCN},
  language     = {eng},
  location     = {St.-Petersburg, Russia},
  pages        = {141--145},
  title        = {Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust},
  year         = {2017},
}