Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust
(2017)
p.141-145
- Author
- Niels Lambrecht (UGent) , Daniël De Zutter (UGent) , Dries Vande Ginste (UGent) and H. Pues
- Organization
- Keywords
- IBCN
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8534391
- MLA
- Lambrecht, Niels, et al. Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust. 2017, pp. 141–45.
- APA
- Lambrecht, N., De Zutter, D., Vande Ginste, D., & Pues, H. (2017). Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust. 141–145.
- Chicago author-date
- Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, and H. Pues. 2017. “Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust.” In , 141–45.
- Chicago author-date (all authors)
- Lambrecht, Niels, Daniël De Zutter, Dries Vande Ginste, and H. Pues. 2017. “Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust.” In , 141–145.
- Vancouver
- 1.Lambrecht N, De Zutter D, Vande Ginste D, Pues H. Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust. In 2017. p. 141–5.
- IEEE
- [1]N. Lambrecht, D. De Zutter, D. Vande Ginste, and H. Pues, “Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust,” presented at the EMCCompo2017, the 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, St.-Petersburg, Russia, 2017, pp. 141–145.
@inproceedings{8534391,
author = {{Lambrecht, Niels and De Zutter, Daniël and Vande Ginste, Dries and Pues, H.}},
isbn = {{978-1-5386-2689-4}},
keywords = {{IBCN}},
language = {{eng}},
location = {{St.-Petersburg, Russia}},
pages = {{141--145}},
title = {{Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust}},
year = {{2017}},
}