Si(100):H and Ge(100):H dimer rows contrast inversion in low-temperature scanning tunneling microscope images
- Author
- Hiroyo Kawai, Tiong Leh Yap, Olga Neucheva, Marek Kolmer, Marek Szymoński, Cedric Troadec, Mark Saeys (UGent) and Christian Joachim
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8533980
- MLA
- Kawai, Hiroyo, et al. “Si(100):H and Ge(100):H Dimer Rows Contrast Inversion in Low-Temperature Scanning Tunneling Microscope Images.” On-Surface Atomic Wires and Logic Gates, Springer International Publishing, 2017, pp. 71–82, doi:10.1007/978-3-319-51847-3_4.
- APA
- Kawai, H., Yap, T. L., Neucheva, O., Kolmer, M., Szymoński, M., Troadec, C., … Joachim, C. (2017). Si(100):H and Ge(100):H dimer rows contrast inversion in low-temperature scanning tunneling microscope images. In On-surface atomic wires and logic gates (pp. 71–82). https://doi.org/10.1007/978-3-319-51847-3_4
- Chicago author-date
- Kawai, Hiroyo, Tiong Leh Yap, Olga Neucheva, Marek Kolmer, Marek Szymoński, Cedric Troadec, Mark Saeys, and Christian Joachim. 2017. “Si(100):H and Ge(100):H Dimer Rows Contrast Inversion in Low-Temperature Scanning Tunneling Microscope Images.” In On-Surface Atomic Wires and Logic Gates, 71–82. Springer International Publishing. https://doi.org/10.1007/978-3-319-51847-3_4.
- Chicago author-date (all authors)
- Kawai, Hiroyo, Tiong Leh Yap, Olga Neucheva, Marek Kolmer, Marek Szymoński, Cedric Troadec, Mark Saeys, and Christian Joachim. 2017. “Si(100):H and Ge(100):H Dimer Rows Contrast Inversion in Low-Temperature Scanning Tunneling Microscope Images.” In On-Surface Atomic Wires and Logic Gates, 71–82. Springer International Publishing. doi:10.1007/978-3-319-51847-3_4.
- Vancouver
- 1.Kawai H, Yap TL, Neucheva O, Kolmer M, Szymoński M, Troadec C, et al. Si(100):H and Ge(100):H dimer rows contrast inversion in low-temperature scanning tunneling microscope images. In: On-surface atomic wires and logic gates. Springer International Publishing; 2017. p. 71–82.
- IEEE
- [1]H. Kawai et al., “Si(100):H and Ge(100):H dimer rows contrast inversion in low-temperature scanning tunneling microscope images,” in On-surface atomic wires and logic gates, Springer International Publishing, 2017, pp. 71–82.
@incollection{8533980,
author = {{Kawai, Hiroyo and Yap, Tiong Leh and Neucheva, Olga and Kolmer, Marek and Szymoński, Marek and Troadec, Cedric and Saeys, Mark and Joachim, Christian}},
booktitle = {{On-surface atomic wires and logic gates}},
isbn = {{9783319518466}},
issn = {{2193-9691}},
language = {{eng}},
pages = {{71--82}},
publisher = {{Springer International Publishing}},
series = {{Advances in Atom and Single Molecule Machines}},
title = {{Si(100):H and Ge(100):H dimer rows contrast inversion in low-temperature scanning tunneling microscope images}},
url = {{http://doi.org/10.1007/978-3-319-51847-3_4}},
year = {{2017}},
}
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