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Nonlinear parametric modelling to study how soil properties affect crop yields and NDVI

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Yield limiting factors, Proximal soil sensing, Nonlinear parametric modelling, VNRX, NEAR-INFRARED-SPECTROSCOPY, LIFE-CYCLE ASSESSMENT, MANAGEMENT ZONES, SYSTEM IDENTIFICATION, ONLINE, GROWTH, SENSOR, REFLECTANCE, DELINEATION, SELECTION

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Citation

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Chicago
Whetton, Rebecca, Yifan Zhao, Sameh Shaddad, and Abdul Mouazen. 2017. “Nonlinear Parametric Modelling to Study How Soil Properties Affect Crop Yields and NDVI.” Computers and Electronics in Agriculture 138: 127–136.
APA
Whetton, R., Zhao, Y., Shaddad, S., & Mouazen, A. (2017). Nonlinear parametric modelling to study how soil properties affect crop yields and NDVI. COMPUTERS AND ELECTRONICS IN AGRICULTURE, 138, 127–136.
Vancouver
1.
Whetton R, Zhao Y, Shaddad S, Mouazen A. Nonlinear parametric modelling to study how soil properties affect crop yields and NDVI. COMPUTERS AND ELECTRONICS IN AGRICULTURE. 2017;138:127–36.
MLA
Whetton, Rebecca, Yifan Zhao, Sameh Shaddad, et al. “Nonlinear Parametric Modelling to Study How Soil Properties Affect Crop Yields and NDVI.” COMPUTERS AND ELECTRONICS IN AGRICULTURE 138 (2017): 127–136. Print.
@article{8523835,
  author       = {Whetton, Rebecca and Zhao, Yifan and Shaddad, Sameh and Mouazen, Abdul},
  issn         = {0168-1699},
  journal      = {COMPUTERS AND ELECTRONICS IN AGRICULTURE},
  keyword      = {Yield limiting factors,Proximal soil sensing,Nonlinear parametric modelling,VNRX,NEAR-INFRARED-SPECTROSCOPY,LIFE-CYCLE ASSESSMENT,MANAGEMENT ZONES,SYSTEM IDENTIFICATION,ONLINE,GROWTH,SENSOR,REFLECTANCE,DELINEATION,SELECTION},
  language     = {eng},
  pages        = {127--136},
  title        = {Nonlinear parametric modelling to study how soil properties affect crop yields and NDVI},
  url          = {http://dx.doi.org/10.1016/j.compag.2017.04.016},
  volume       = {138},
  year         = {2017},
}

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