A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity
- Author
- Paolo Manfredi (UGent) , Xinglong Wu, Flavia Grassi, Dries Vande Ginste (UGent) and Sergio A. Pignari
- Organization
- Keywords
- IBCN, Eye diagram, differential lines, mode conversion, nonuniform transmission lines, perturbation approach
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8522942
- MLA
- Manfredi, Paolo, et al. “A Perturbative Approach to Predict Eye Diagram Degradation in Differential Interconnects Subject to Asymmetry and Nonuniformity.” 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI), IEEE, 2017, pp. 1–4, doi:10.1109/sapiw.2017.7944000.
- APA
- Manfredi, P., Wu, X., Grassi, F., Vande Ginste, D., & Pignari, S. A. (2017). A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity. 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI), 1–4. https://doi.org/10.1109/sapiw.2017.7944000
- Chicago author-date
- Manfredi, Paolo, Xinglong Wu, Flavia Grassi, Dries Vande Ginste, and Sergio A. Pignari. 2017. “A Perturbative Approach to Predict Eye Diagram Degradation in Differential Interconnects Subject to Asymmetry and Nonuniformity.” In 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI), 1–4. IEEE. https://doi.org/10.1109/sapiw.2017.7944000.
- Chicago author-date (all authors)
- Manfredi, Paolo, Xinglong Wu, Flavia Grassi, Dries Vande Ginste, and Sergio A. Pignari. 2017. “A Perturbative Approach to Predict Eye Diagram Degradation in Differential Interconnects Subject to Asymmetry and Nonuniformity.” In 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI), 1–4. IEEE. doi:10.1109/sapiw.2017.7944000.
- Vancouver
- 1.Manfredi P, Wu X, Grassi F, Vande Ginste D, Pignari SA. A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity. In: 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI). IEEE; 2017. p. 1–4.
- IEEE
- [1]P. Manfredi, X. Wu, F. Grassi, D. Vande Ginste, and S. A. Pignari, “A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity,” in 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI), Baveno, ITALY, 2017, pp. 1–4.
@inproceedings{8522942,
author = {{Manfredi, Paolo and Wu, Xinglong and Grassi, Flavia and Vande Ginste, Dries and Pignari, Sergio A.}},
booktitle = {{2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI)}},
isbn = {{978-1-5090-5616-3}},
issn = {{2475-9481}},
keywords = {{IBCN,Eye diagram,differential lines,mode conversion,nonuniform transmission lines,perturbation approach}},
language = {{eng}},
location = {{Baveno, ITALY}},
pages = {{1--4}},
publisher = {{IEEE}},
title = {{A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity}},
url = {{http://doi.org/10.1109/sapiw.2017.7944000}},
year = {{2017}},
}
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