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A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity

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IBCN, Eye diagram, differential lines, mode conversion, nonuniform transmission lines, perturbation approach

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Citation

Please use this url to cite or link to this publication:

Chicago
Manfredi, Paolo, Xinglong Wu, Flavia Grassi, Dries Vande Ginste, and Sergio A. Pignari. 2017. “A Perturbative Approach to Predict Eye Diagram Degradation in Differential Interconnects Subject to Asymmetry and Nonuniformity.” In 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI) , 1–4. IEEE.
APA
Manfredi, P., Wu, X., Grassi, F., Vande Ginste, D., & Pignari, S. A. (2017). A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity. 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI) (pp. 1–4). Presented at the 21st IEEE Workshop on Signal and Power Integrity (SPI) , IEEE.
Vancouver
1.
Manfredi P, Wu X, Grassi F, Vande Ginste D, Pignari SA. A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity. 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI) . IEEE; 2017. p. 1–4.
MLA
Manfredi, Paolo et al. “A Perturbative Approach to Predict Eye Diagram Degradation in Differential Interconnects Subject to Asymmetry and Nonuniformity.” 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI) . IEEE, 2017. 1–4. Print.
@inproceedings{8522942,
  author       = {Manfredi, Paolo and Wu, Xinglong and Grassi, Flavia and Vande Ginste, Dries and Pignari, Sergio A.},
  booktitle    = {2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI) },
  isbn         = {978-1-5090-5616-3},
  issn         = {2475-9481 },
  keywords     = {IBCN,Eye diagram,differential lines,mode conversion,nonuniform transmission lines,perturbation approach},
  language     = {eng},
  location     = {Baveno, ITALY},
  pages        = {1--4},
  publisher    = {IEEE},
  title        = {A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity},
  url          = {http://dx.doi.org/10.1109/sapiw.2017.7944000},
  year         = {2017},
}

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