Sensitivity analysis of expensive black-box systems using metamodeling
- Author
- Tom Van Steenkiste, Joachim van der Herten (UGent) , Ivo Couckuyt (UGent) and Tom Dhaene (UGent)
- Organization
- Keywords
- IBCN
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8506678
- MLA
- Van Steenkiste, Tom, et al. “Sensitivity Analysis of Expensive Black-Box Systems Using Metamodeling.” 2016 WINTER SIMULATION CONFERENCE (WSC), Institute of Electrical and Electronics Engineers (IEEE), 2016, pp. 578–89, doi:10.1109/wsc.2016.7822123.
- APA
- Van Steenkiste, T., van der Herten, J., Couckuyt, I., & Dhaene, T. (2016). Sensitivity analysis of expensive black-box systems using metamodeling. 2016 WINTER SIMULATION CONFERENCE (WSC), 578–589. https://doi.org/10.1109/wsc.2016.7822123
- Chicago author-date
- Van Steenkiste, Tom, Joachim van der Herten, Ivo Couckuyt, and Tom Dhaene. 2016. “Sensitivity Analysis of Expensive Black-Box Systems Using Metamodeling.” In 2016 WINTER SIMULATION CONFERENCE (WSC), 578–89. Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/wsc.2016.7822123.
- Chicago author-date (all authors)
- Van Steenkiste, Tom, Joachim van der Herten, Ivo Couckuyt, and Tom Dhaene. 2016. “Sensitivity Analysis of Expensive Black-Box Systems Using Metamodeling.” In 2016 WINTER SIMULATION CONFERENCE (WSC), 578–589. Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/wsc.2016.7822123.
- Vancouver
- 1.Van Steenkiste T, van der Herten J, Couckuyt I, Dhaene T. Sensitivity analysis of expensive black-box systems using metamodeling. In: 2016 WINTER SIMULATION CONFERENCE (WSC). Institute of Electrical and Electronics Engineers (IEEE); 2016. p. 578–89.
- IEEE
- [1]T. Van Steenkiste, J. van der Herten, I. Couckuyt, and T. Dhaene, “Sensitivity analysis of expensive black-box systems using metamodeling,” in 2016 WINTER SIMULATION CONFERENCE (WSC), Washington, USA, 2016, pp. 578–589.
@inproceedings{8506678,
author = {{Van Steenkiste, Tom and van der Herten, Joachim and Couckuyt, Ivo and Dhaene, Tom}},
booktitle = {{2016 WINTER SIMULATION CONFERENCE (WSC)}},
isbn = {{978-1-5090-4486-3}},
issn = {{0891-7736}},
keywords = {{IBCN}},
language = {{eng}},
location = {{Washington, USA}},
pages = {{578--589}},
publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},
title = {{Sensitivity analysis of expensive black-box systems using metamodeling}},
url = {{http://dx.doi.org/10.1109/wsc.2016.7822123}},
year = {{2016}},
}
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