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Sensitivity analysis of expensive black-box systems using metamodeling

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Citation

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MLA
Van Steenkiste, Tom, et al. “Sensitivity Analysis of Expensive Black-Box Systems Using Metamodeling.” 2016 WINTER SIMULATION CONFERENCE (WSC), Institute of Electrical and Electronics Engineers (IEEE), 2016, pp. 578–89, doi:10.1109/wsc.2016.7822123.
APA
Van Steenkiste, T., van der Herten, J., Couckuyt, I., & Dhaene, T. (2016). Sensitivity analysis of expensive black-box systems using metamodeling. 2016 WINTER SIMULATION CONFERENCE (WSC), 578–589. https://doi.org/10.1109/wsc.2016.7822123
Chicago author-date
Van Steenkiste, Tom, Joachim van der Herten, Ivo Couckuyt, and Tom Dhaene. 2016. “Sensitivity Analysis of Expensive Black-Box Systems Using Metamodeling.” In 2016 WINTER SIMULATION CONFERENCE (WSC), 578–89. Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/wsc.2016.7822123.
Chicago author-date (all authors)
Van Steenkiste, Tom, Joachim van der Herten, Ivo Couckuyt, and Tom Dhaene. 2016. “Sensitivity Analysis of Expensive Black-Box Systems Using Metamodeling.” In 2016 WINTER SIMULATION CONFERENCE (WSC), 578–589. Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/wsc.2016.7822123.
Vancouver
1.
Van Steenkiste T, van der Herten J, Couckuyt I, Dhaene T. Sensitivity analysis of expensive black-box systems using metamodeling. In: 2016 WINTER SIMULATION CONFERENCE (WSC). Institute of Electrical and Electronics Engineers (IEEE); 2016. p. 578–89.
IEEE
[1]
T. Van Steenkiste, J. van der Herten, I. Couckuyt, and T. Dhaene, “Sensitivity analysis of expensive black-box systems using metamodeling,” in 2016 WINTER SIMULATION CONFERENCE (WSC), Washington, USA, 2016, pp. 578–589.
@inproceedings{8506678,
  author       = {{Van Steenkiste, Tom and van der Herten, Joachim and Couckuyt, Ivo and Dhaene, Tom}},
  booktitle    = {{2016 WINTER SIMULATION CONFERENCE (WSC)}},
  isbn         = {{978-1-5090-4486-3}},
  issn         = {{0891-7736}},
  keywords     = {{IBCN}},
  language     = {{eng}},
  location     = {{Washington, USA}},
  pages        = {{578--589}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{Sensitivity analysis of expensive black-box systems using metamodeling}},
  url          = {{http://dx.doi.org/10.1109/wsc.2016.7822123}},
  year         = {{2016}},
}

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