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Automated Membrane Detection in Electron Microscopy using Convolutional Neural Networks

Joris Roels (UGent) , Jonas De Vylder (UGent) , Jan Aelterman (UGent) , Yvan Saeys (UGent) and Wilfried Philips (UGent)
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Chicago
Roels, Joris, Jonas De Vylder, Jan Aelterman, Yvan Saeys, and Wilfried Philips. 2016. “Automated Membrane Detection in Electron Microscopy Using Convolutional Neural Networks.” In Belgian-Dutch Conference on Machine Learning, Abstracts.
APA
Roels, Joris, De Vylder, J., Aelterman, J., Saeys, Y., & Philips, W. (2016). Automated Membrane Detection in Electron Microscopy using Convolutional Neural Networks. Belgian-Dutch Conference on Machine Learning, Abstracts. Presented at the Belgian-Dutch Conference on Machine Learning.
Vancouver
1.
Roels J, De Vylder J, Aelterman J, Saeys Y, Philips W. Automated Membrane Detection in Electron Microscopy using Convolutional Neural Networks. Belgian-Dutch Conference on Machine Learning, Abstracts. 2016.
MLA
Roels, Joris, Jonas De Vylder, Jan Aelterman, et al. “Automated Membrane Detection in Electron Microscopy Using Convolutional Neural Networks.” Belgian-Dutch Conference on Machine Learning, Abstracts. 2016. Print.
@inproceedings{8505980,
  author       = {Roels, Joris and De Vylder, Jonas and Aelterman, Jan and Saeys, Yvan and Philips, Wilfried},
  booktitle    = {Belgian-Dutch Conference on Machine Learning, Abstracts},
  title        = {Automated Membrane Detection in Electron Microscopy using Convolutional Neural Networks},
  year         = {2016},
}