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Semi-automated segmentation in 3D electron microscopy imaging

Joris Roels (UGent) , Jan Aelterman (UGent) , Jonas De Vylder (UGent) , Hiep Luong (UGent) , Saskia Lippens (UGent) , Yvan Saeys (UGent) and Wilfried Philips (UGent)
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Chicago
Roels, Joris, Jan Aelterman, Jonas De Vylder, Hiep Luong, Saskia Lippens, Yvan Saeys, and Wilfried Philips. 2016. “Semi-automated Segmentation in 3D Electron Microscopy Imaging.” In Knowledge For Growth, Abstracts.
APA
Roels, Joris, Aelterman, J., De Vylder, J., Luong, H., Lippens, S., Saeys, Y., & Philips, W. (2016). Semi-automated segmentation in 3D electron microscopy imaging. Knowledge For Growth, Abstracts. Presented at the Knowledge For Growth.
Vancouver
1.
Roels J, Aelterman J, De Vylder J, Luong H, Lippens S, Saeys Y, et al. Semi-automated segmentation in 3D electron microscopy imaging. Knowledge For Growth, Abstracts. 2016.
MLA
Roels, Joris, Jan Aelterman, Jonas De Vylder, et al. “Semi-automated Segmentation in 3D Electron Microscopy Imaging.” Knowledge For Growth, Abstracts. 2016. Print.
@inproceedings{8505979,
  author       = {Roels, Joris and Aelterman, Jan and De Vylder, Jonas and Luong, Hiep and Lippens, Saskia and Saeys, Yvan and Philips, Wilfried},
  booktitle    = {Knowledge For Growth, Abstracts},
  title        = {Semi-automated segmentation in 3D electron microscopy imaging},
  year         = {2016},
}