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In situ synchrotron based fluorescence and scattering techniques: a study of quantum dot encapsulation by atomic layer deposition

Kilian Devloo-Casier (2016)
Please use this url to cite or link to this publication:
author
promoter
UGent and UGent
organization
year
type
dissertation
publication status
published
subject
pages
XIV, 148 pages
publisher
Ghent University. Faculty of Sciences
place of publication
Ghent, Belgium
defense location
Gent : Campus Sterre (S2, auditorium 1e verd.)
defense date
2016-07-01 16:00
language
English
UGent publication?
yes
classification
D1
copyright statement
I have transferred the copyright for this publication to the publisher
id
8023835
handle
http://hdl.handle.net/1854/LU-8023835
date created
2016-07-02 14:08:07
date last changed
2017-01-16 10:51:56
@phdthesis{8023835,
  author       = {Devloo-Casier, Kilian},
  language     = {eng},
  pages        = {XIV, 148},
  publisher    = {Ghent University. Faculty of Sciences},
  school       = {Ghent University},
  title        = {In situ synchrotron based fluorescence and scattering techniques: a study of quantum dot encapsulation by atomic layer deposition},
  year         = {2016},
}

Chicago
Devloo-Casier, Kilian. 2016. “In Situ Synchrotron Based Fluorescence and Scattering Techniques: a Study of Quantum Dot Encapsulation by Atomic Layer Deposition”. Ghent, Belgium: Ghent University. Faculty of Sciences.
APA
Devloo-Casier, K. (2016). In situ synchrotron based fluorescence and scattering techniques: a study of quantum dot encapsulation by atomic layer deposition. Ghent University. Faculty of Sciences, Ghent, Belgium.
Vancouver
1.
Devloo-Casier K. In situ synchrotron based fluorescence and scattering techniques: a study of quantum dot encapsulation by atomic layer deposition. [Ghent, Belgium]: Ghent University. Faculty of Sciences; 2016.
MLA
Devloo-Casier, Kilian. “In Situ Synchrotron Based Fluorescence and Scattering Techniques: a Study of Quantum Dot Encapsulation by Atomic Layer Deposition.” 2016 : n. pag. Print.