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In situ synchrotron based fluorescence and scattering techniques : a study of quantum dot encapsulation by atomic layer deposition

(2016)
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Chicago
Devloo-Casier, Kilian. 2016. “In Situ Synchrotron Based Fluorescence and Scattering Techniques : a Study of Quantum Dot Encapsulation by Atomic Layer Deposition”. Ghent, Belgium: Ghent University. Faculty of Sciences.
APA
Devloo-Casier, K. (2016). In situ synchrotron based fluorescence and scattering techniques : a study of quantum dot encapsulation by atomic layer deposition. Ghent University. Faculty of Sciences, Ghent, Belgium.
Vancouver
1.
Devloo-Casier K. In situ synchrotron based fluorescence and scattering techniques : a study of quantum dot encapsulation by atomic layer deposition. [Ghent, Belgium]: Ghent University. Faculty of Sciences; 2016.
MLA
Devloo-Casier, Kilian. “In Situ Synchrotron Based Fluorescence and Scattering Techniques : a Study of Quantum Dot Encapsulation by Atomic Layer Deposition.” 2016 : n. pag. Print.
@phdthesis{8023835,
  author       = {Devloo-Casier, Kilian},
  language     = {eng},
  pages        = {XIV, 148},
  publisher    = {Ghent University. Faculty of Sciences},
  school       = {Ghent University},
  title        = {In situ synchrotron based fluorescence and scattering techniques : a study of quantum dot encapsulation by atomic layer deposition},
  year         = {2016},
}