Advanced search
2 files | 2.50 MB

Stochastic collocation for device-level variability analysis in integrated photonics

Yufei Xing (UGent) , Domenico Spina (UGent) , Ang Li (UGent) , Tom Dhaene (UGent) and Wim Bogaerts (UGent)
(2016) PHOTONICS RESEARCH. 4(2). p.93-100
Author
Organization
Project
Center for nano- and biophotonics (NB-Photonics)

Downloads

  • pub 1832a.pdf
    • full text
    • |
    • open access
    • |
    • PDF
    • |
    • 1.74 MB
  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 768.03 KB

Citation

Please use this url to cite or link to this publication:

Chicago
Xing, Yufei, Domenico Spina, Ang Li, Tom Dhaene, and Wim Bogaerts. 2016. “Stochastic Collocation for Device-level Variability Analysis in Integrated Photonics.” Photonics Research 4 (2): 93–100.
APA
Xing, Y., Spina, D., Li, A., Dhaene, T., & Bogaerts, W. (2016). Stochastic collocation for device-level variability analysis in integrated photonics. PHOTONICS RESEARCH, 4(2), 93–100.
Vancouver
1.
Xing Y, Spina D, Li A, Dhaene T, Bogaerts W. Stochastic collocation for device-level variability analysis in integrated photonics. PHOTONICS RESEARCH. 2016;4(2):93–100.
MLA
Xing, Yufei, Domenico Spina, Ang Li, et al. “Stochastic Collocation for Device-level Variability Analysis in Integrated Photonics.” PHOTONICS RESEARCH 4.2 (2016): 93–100. Print.
@article{7276642,
  author       = {Xing, Yufei and Spina, Domenico and Li, Ang and Dhaene, Tom and Bogaerts, Wim},
  issn         = {2327-9125},
  journal      = {PHOTONICS RESEARCH},
  language     = {eng},
  number       = {2},
  pages        = {93--100},
  title        = {Stochastic collocation for device-level variability analysis in integrated photonics},
  url          = {http://dx.doi.org/10.1364/PRJ.4.000093},
  volume       = {4},
  year         = {2016},
}

Altmetric
View in Altmetric
Web of Science
Times cited: