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Quantitative analysis of TM lateral leakage in foundry fabricated silicon Rib waveguides

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Center for nano- and biophotonics (NB-Photonics)
Abstract
We show that thin, shallow ridge, silicon-on-insulator waveguides exhibiting a lateral leakage behavior can be designed and fabricated using a standard silicon photonic foundry platform. We analyze the propagation loss through the observation of the transmitted TM polarized guided mode and TE polarized radiation and experimentally demonstrate that propagation losses as low as 0.087 dB/mm can be achieved. This demonstration will open a new frontier for practical devices exploiting a lateral leakage behavior with potential applications in the fields of biosensing and quantum optics among others.
Keywords
COUPLERS, CIRCUITS, MODE, Silicon-on-insulator, integrated circuit technology, optical waveguides

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Citation

Please use this url to cite or link to this publication:

Chicago
Hope, Anthony P., Thach G. Nguyen, Arnan Mitchell, and Wim Bogaerts. 2016. “Quantitative Analysis of TM Lateral Leakage in Foundry Fabricated Silicon Rib Waveguides.” Ieee Photonics Technology Letters 28 (4): 493–496.
APA
Hope, A. P., Nguyen, T. G., Mitchell, A., & Bogaerts, W. (2016). Quantitative analysis of TM lateral leakage in foundry fabricated silicon Rib waveguides. IEEE PHOTONICS TECHNOLOGY LETTERS, 28(4), 493–496.
Vancouver
1.
Hope AP, Nguyen TG, Mitchell A, Bogaerts W. Quantitative analysis of TM lateral leakage in foundry fabricated silicon Rib waveguides. IEEE PHOTONICS TECHNOLOGY LETTERS. 2016;28(4):493–6.
MLA
Hope, Anthony P., Thach G. Nguyen, Arnan Mitchell, et al. “Quantitative Analysis of TM Lateral Leakage in Foundry Fabricated Silicon Rib Waveguides.” IEEE PHOTONICS TECHNOLOGY LETTERS 28.4 (2016): 493–496. Print.
@article{7276572,
  abstract     = {We show that thin, shallow ridge, silicon-on-insulator waveguides exhibiting a lateral leakage behavior can be designed and fabricated using a standard silicon photonic foundry platform. We analyze the propagation loss through the observation of the transmitted TM polarized guided mode and TE polarized radiation and experimentally demonstrate that propagation losses as low as 0.087 dB/mm can be achieved. This demonstration will open a new frontier for practical devices exploiting a lateral leakage behavior with potential applications in the fields of biosensing and quantum optics among others.},
  author       = {Hope, Anthony P. and Nguyen, Thach G. and Mitchell, Arnan and Bogaerts, Wim},
  issn         = {1041-1135},
  journal      = {IEEE PHOTONICS TECHNOLOGY LETTERS},
  keyword      = {COUPLERS,CIRCUITS,MODE,Silicon-on-insulator,integrated circuit technology,optical waveguides},
  language     = {eng},
  number       = {4},
  pages        = {493--496},
  title        = {Quantitative analysis of TM lateral leakage in foundry fabricated silicon Rib waveguides},
  url          = {http://dx.doi.org/10.1109/LPT.2015.2500233},
  volume       = {28},
  year         = {2016},
}

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