Characterization of structural change in rails surface using advance automatic crystallographic orientation microscopy
(2016)
- Author
- Jun Wu, Roumen Petrov (UGent) , Shaoguang Li, Zili Li, Stephane Godet, Loic Malet and Jilt Sietsma (UGent)
- Organization
- Abstract
- Surface structural changes, formed during wheel/rail contact, in R260Mn grade rail were investigated by electron backscatter diffraction (EBSD), transmission Kikuchi diffraction (TKD) in scanning electron microscope (SEM) and automatic crystal orientation mapping in transmission electron microscope (ACOM-TEM). Grain fragmentation and refinement of ferrite are characterized by all applied methods as well as grain alignment towards traffic direction. Substructures, having misorientation lower than 5°, are identified by kernel average misorientation (KAM). Detection of retained austenite indicates martensitic nature of the structural change observed in the heavily deformed surface layer.
- Keywords
- martensite, Kurdjumov-Sachs( K-S ) orientation relationship., retained austenite, automatic crystal orientation mapping in transmission electron microscope (ACOM-TEM), transmission Kikuchi diffraction (TKD), pearlitic rails, electron backscattered diffraction (EBSD), surface structural change, brown etching layer (BEL)
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-7257951
- MLA
- Wu, Jun, et al. Characterization of Structural Change in Rails Surface Using Advance Automatic Crystallographic Orientation Microscopy. 2016.
- APA
- Wu, J., Petrov, R., Li, S., Li, Z., Godet, S., Malet, L., & Sietsma, J. (2016). Characterization of structural change in rails surface using advance automatic crystallographic orientation microscopy. Presented at the Materials Characterization 2015, Valencia, Spain.
- Chicago author-date
- Wu, Jun, Roumen Petrov, Shaoguang Li, Zili Li, Stephane Godet, Loic Malet, and Jilt Sietsma. 2016. “Characterization of Structural Change in Rails Surface Using Advance Automatic Crystallographic Orientation Microscopy.” In .
- Chicago author-date (all authors)
- Wu, Jun, Roumen Petrov, Shaoguang Li, Zili Li, Stephane Godet, Loic Malet, and Jilt Sietsma. 2016. “Characterization of Structural Change in Rails Surface Using Advance Automatic Crystallographic Orientation Microscopy.” In .
- Vancouver
- 1.Wu J, Petrov R, Li S, Li Z, Godet S, Malet L, et al. Characterization of structural change in rails surface using advance automatic crystallographic orientation microscopy. In 2016.
- IEEE
- [1]J. Wu et al., “Characterization of structural change in rails surface using advance automatic crystallographic orientation microscopy,” presented at the Materials Characterization 2015, Valencia, Spain, 2016.
@inproceedings{7257951,
abstract = {{Surface structural changes, formed during wheel/rail contact, in R260Mn grade rail were investigated by electron backscatter diffraction (EBSD), transmission Kikuchi diffraction (TKD) in scanning electron microscope (SEM) and automatic crystal orientation mapping in transmission electron microscope (ACOM-TEM). Grain fragmentation and refinement of ferrite are characterized by all applied methods as well as grain alignment towards traffic direction. Substructures, having misorientation lower than 5°, are identified by kernel average misorientation (KAM). Detection of retained austenite indicates martensitic nature of the structural change observed in the heavily deformed surface layer.}},
author = {{Wu, Jun and Petrov, Roumen and Li, Shaoguang and Li, Zili and Godet, Stephane and Malet, Loic and Sietsma, Jilt}},
keywords = {{martensite,Kurdjumov-Sachs( K-S ) orientation relationship.,retained austenite,automatic crystal orientation mapping in transmission electron microscope (ACOM-TEM),transmission Kikuchi diffraction (TKD),pearlitic rails,electron backscattered diffraction (EBSD),surface structural change,brown etching layer (BEL)}},
language = {{eng}},
location = {{Valencia, Spain}},
title = {{Characterization of structural change in rails surface using advance automatic crystallographic orientation microscopy}},
year = {{2016}},
}