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Study of chalcogenide thin films and their application as a cation supply layer in conductive bridge random access memory devices

Wouter Devulder (UGent)
(2016)
Author
Promoter
(UGent)
Organization
Keywords
XPS, in situ XRD, thermal stability, CBRAM, chalcogenides, resistive memory

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Citation

Please use this url to cite or link to this publication:

Chicago
Devulder, Wouter. 2016. “Study of Chalcogenide Thin Films and Their Application as a Cation Supply Layer in Conductive Bridge Random Access Memory Devices”. Ghent, Belgium: Ghent University. Faculty of Sciences.
APA
Devulder, W. (2016). Study of chalcogenide thin films and their application as a cation supply layer in conductive bridge random access memory devices. Ghent University. Faculty of Sciences, Ghent, Belgium.
Vancouver
1.
Devulder W. Study of chalcogenide thin films and their application as a cation supply layer in conductive bridge random access memory devices. [Ghent, Belgium]: Ghent University. Faculty of Sciences; 2016.
MLA
Devulder, Wouter. “Study of Chalcogenide Thin Films and Their Application as a Cation Supply Layer in Conductive Bridge Random Access Memory Devices.” 2016 : n. pag. Print.
@phdthesis{7201481,
  author       = {Devulder, Wouter},
  keywords     = {XPS,in situ XRD,thermal stability,CBRAM,chalcogenides,resistive memory},
  language     = {eng},
  pages        = {XVII, 260},
  publisher    = {Ghent University. Faculty of Sciences},
  school       = {Ghent University},
  title        = {Study of chalcogenide thin films and their application as a cation supply layer in conductive bridge random access memory devices},
  year         = {2016},
}