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Experimental extraction of effective refractive index and thermo-optic coefficients of silicon-on-insulator waveguides using interferometers

Sarvagya Dwivedi (UGent) , Alfonso Ruocco (UGent) , Michaël Vanslembrouck (UGent) , Thijs Spuesens (UGent) , Peter Bienstman (UGent) , Pieter Dumon (UGent) , Thomas Van Vaerenbergh (UGent) and Wim Bogaerts (UGent)
(2015) JOURNAL OF LIGHTWAVE TECHNOLOGY. 33(21). p.4471-4477
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Center for nano- and biophotonics (NB-Photonics)
Abstract
We propose and demonstrate an accurate method of measuring the effective refractive index and thermo-optic coefficient of silicon-on-insulator waveguides in the entire C-band using three Mach-Zehnder interferometers. The method allows for accurate extraction of the wavelength dispersion and takes into account fabrication variability. Wafer scale measurements are performed and the effective refractive index variations are presented for three different waveguide widths: 450, 600, and 800 nm, for the TE polarization. The presented method is generic and can be applied to other waveguide geometries and material systems and for different wavelengths and polarizations.
Keywords
wavelength filtering devices, DISPERSION, waveguides, thermo-optic coefficients, Effective refractive index

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Citation

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MLA
Dwivedi, Sarvagya et al. “Experimental Extraction of Effective Refractive Index and Thermo-optic Coefficients of Silicon-on-insulator Waveguides Using Interferometers.” JOURNAL OF LIGHTWAVE TECHNOLOGY 33.21 (2015): 4471–4477. Print.
APA
Dwivedi, S., Ruocco, A., Vanslembrouck, M., Spuesens, T., Bienstman, P., Dumon, P., Van Vaerenbergh, T., et al. (2015). Experimental extraction of effective refractive index and thermo-optic coefficients of silicon-on-insulator waveguides using interferometers. JOURNAL OF LIGHTWAVE TECHNOLOGY, 33(21), 4471–4477.
Chicago author-date
Dwivedi, Sarvagya, Alfonso Ruocco, Michaël Vanslembrouck, Thijs Spuesens, Peter Bienstman, Pieter Dumon, Thomas Van Vaerenbergh, and Wim Bogaerts. 2015. “Experimental Extraction of Effective Refractive Index and Thermo-optic Coefficients of Silicon-on-insulator Waveguides Using Interferometers.” Journal of Lightwave Technology 33 (21): 4471–4477.
Chicago author-date (all authors)
Dwivedi, Sarvagya, Alfonso Ruocco, Michaël Vanslembrouck, Thijs Spuesens, Peter Bienstman, Pieter Dumon, Thomas Van Vaerenbergh, and Wim Bogaerts. 2015. “Experimental Extraction of Effective Refractive Index and Thermo-optic Coefficients of Silicon-on-insulator Waveguides Using Interferometers.” Journal of Lightwave Technology 33 (21): 4471–4477.
Vancouver
1.
Dwivedi S, Ruocco A, Vanslembrouck M, Spuesens T, Bienstman P, Dumon P, et al. Experimental extraction of effective refractive index and thermo-optic coefficients of silicon-on-insulator waveguides using interferometers. JOURNAL OF LIGHTWAVE TECHNOLOGY. 2015;33(21):4471–7.
IEEE
[1]
S. Dwivedi et al., “Experimental extraction of effective refractive index and thermo-optic coefficients of silicon-on-insulator waveguides using interferometers,” JOURNAL OF LIGHTWAVE TECHNOLOGY, vol. 33, no. 21, pp. 4471–4477, 2015.
@article{7065396,
  abstract     = {We propose and demonstrate an accurate method of measuring the effective refractive index and thermo-optic coefficient of silicon-on-insulator waveguides in the entire C-band using three Mach-Zehnder interferometers. The method allows for accurate extraction of the wavelength dispersion and takes into account fabrication variability. Wafer scale measurements are performed and the effective refractive index variations are presented for three different waveguide widths: 450, 600, and 800 nm, for the TE polarization. The presented method is generic and can be applied to other waveguide geometries and material systems and for different wavelengths and polarizations.},
  author       = {Dwivedi, Sarvagya and Ruocco, Alfonso and Vanslembrouck, Michaël and Spuesens, Thijs and Bienstman, Peter and Dumon, Pieter and Van Vaerenbergh, Thomas and Bogaerts, Wim},
  issn         = {0733-8724},
  journal      = {JOURNAL OF LIGHTWAVE TECHNOLOGY},
  keywords     = {wavelength filtering devices,DISPERSION,waveguides,thermo-optic coefficients,Effective refractive index},
  language     = {eng},
  number       = {21},
  pages        = {4471--4477},
  title        = {Experimental extraction of effective refractive index and thermo-optic coefficients of silicon-on-insulator waveguides using interferometers},
  url          = {http://dx.doi.org/10.1109/JLT.2015.2476603},
  volume       = {33},
  year         = {2015},
}

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