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X-ray micro-tomography under altered environmental conditions with EMCT-scanner

Denis Van Loo, Bert Masschaele UGent, Veerle Cnudde UGent, Manuel Dierick UGent, Jelle Vlassenbroeck UGent, Yoni De Witte UGent, Matthieu Boone UGent and Jan Dewanckele UGent (2008) Book of abstracts : 9th international conference on X‐ray microscopy. p.233-233
abstract
In many research fields the use of micro and even sub-micron X-ray tomography has become an indispensable tool in acquiring and analyzing complex 3D structures. Especially in the field of material science, the non-destructive character of this technique has proven to be very valuable. Effectuating repetitive scans of material samples in different environmental conditions even permits in depth evaluation of physical material properties such as crack propagation and failure. However, applying a variable environment, whether mechanical loading, humidity or temperature changes is not straightforward in current CT-scanners. Standard micro-CT scanners are inconvenient because the sample has to rotate while in vivo-scanners have limited spatial resolution and are unpractical for applying external conditions. During the last years, the centre for X-ray Tomography of Ghent University (UGCT) has specialized in designing dedicated high resolution CT scanners for laboratory research. Recently an environmental micro- CT scanner (EMCT) was developed at our facility with the purpose to permit easy, constant and automatic environmental changes during scan sessions for samples ranging from a few millimeters up to 15 cm in diameter. The EMCT works with fixed sample but rotating tube/detector structure. The X-ray tube in the EMCT scanner is installed on a translation stage together with the detector, this stage is mounted on a rotating ring. By bringing the source closer to the sample, magnification is increased and therefore the spatial resolution. In addition, dedicated appendages have been developed to apply extreme conditions on the samples and both the scanner control software as well as the acquisition and reconstruction software that are in house developed, were adapted to this new way of semi-dynamic scanning. With these kind of setups, materials can be tested in an environment and under conditions close to what they endure in sito.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Book of abstracts : 9th international conference on X‐ray microscopy
pages
233 - 233
conference name
9th International conference on X‐Ray Microscopy (XRM 2008)
conference location
Zürich, Switzerland
conference start
2008-07-21
conference end
2008-07-25
language
English
UGent publication?
yes
classification
C3
id
697280
handle
http://hdl.handle.net/1854/LU-697280
date created
2009-06-14 17:07:59
date last changed
2016-12-19 15:35:18
@inproceedings{697280,
  abstract     = {In many research fields the use of micro and even sub-micron X-ray tomography  has become an indispensable tool in acquiring and analyzing complex 3D structures. Especially in the field of material science, the non-destructive character of this technique has proven to be very valuable. Effectuating repetitive scans of material samples in different environmental conditions even permits in depth evaluation of physical material properties such as crack propagation and failure. However, applying a variable environment, whether mechanical loading, humidity or temperature changes is not straightforward in current CT-scanners. Standard micro-CT scanners are inconvenient because the sample has to rotate while in vivo-scanners have limited spatial resolution and are unpractical for applying external conditions.
During the last years, the centre for X-ray Tomography of Ghent University (UGCT) has specialized in designing dedicated high resolution CT scanners for laboratory research. Recently an environmental micro- CT scanner (EMCT)  was developed at our facility with the purpose to permit easy, constant and automatic environmental changes during scan sessions for samples ranging from a few millimeters up to 15 cm in diameter. The EMCT works with fixed sample but rotating tube/detector structure. 
The X-ray tube in the EMCT scanner is installed on a translation stage together with the detector, this stage is mounted on a rotating ring. By bringing the source closer to the sample, magnification is increased and therefore the spatial resolution. In addition, dedicated appendages have been developed to apply extreme conditions on the samples and both the scanner control software as well as the acquisition and reconstruction software that are in house developed, were adapted to this new way of semi-dynamic  scanning. With these kind of setups, materials can be tested in an environment and under conditions close to what they endure in sito.},
  author       = {Van Loo, Denis and Masschaele, Bert and Cnudde, Veerle and Dierick, Manuel and Vlassenbroeck, Jelle and De Witte, Yoni and Boone, Matthieu and Dewanckele, Jan},
  booktitle    = {Book of abstracts : 9th international conference on X\unmatched{2010}ray microscopy},
  language     = {eng},
  location     = {Z{\"u}rich, Switzerland},
  pages        = {233--233},
  title        = {X-ray micro-tomography under altered environmental conditions with EMCT-scanner},
  year         = {2008},
}

Chicago
Van Loo, Denis, Bert Masschaele, Veerle Cnudde, Manuel Dierick, Jelle Vlassenbroeck, Yoni De Witte, Matthieu Boone, and Jan Dewanckele. 2008. “X-ray Micro-tomography Under Altered Environmental Conditions with EMCT-scanner.” In Book of Abstracts : 9th International Conference on X‐ray Microscopy, 233–233.
APA
Van Loo, D., Masschaele, B., Cnudde, V., Dierick, M., Vlassenbroeck, J., De Witte, Y., Boone, M., et al. (2008). X-ray micro-tomography under altered environmental conditions with EMCT-scanner. Book of abstracts : 9th international conference on X‐ray microscopy (pp. 233–233). Presented at the 9th International conference on X‐Ray Microscopy (XRM 2008).
Vancouver
1.
Van Loo D, Masschaele B, Cnudde V, Dierick M, Vlassenbroeck J, De Witte Y, et al. X-ray micro-tomography under altered environmental conditions with EMCT-scanner. Book of abstracts : 9th international conference on X‐ray microscopy. 2008. p. 233–233.
MLA
Van Loo, Denis, Bert Masschaele, Veerle Cnudde, et al. “X-ray Micro-tomography Under Altered Environmental Conditions with EMCT-scanner.” Book of Abstracts : 9th International Conference on X‐ray Microscopy. 2008. 233–233. Print.