Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
- Author
- Eddy Simoen (UGent) , Bogdan Cretu, Wen Fang, Marc Aoulaiche, Jean-Marc Routoure, Regis Carin, Jun Luo, Chao Zhao and Cor Claeys
- Organization
Downloads
-
(...).pdf
- full text
- |
- UGent only
- |
- |
- 1.18 MB
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-6942633
- MLA
- Simoen, Eddy, Bogdan Cretu, Wen Fang, et al. “Low-frequency Noise Spectroscopy of Bulk and Border Traps in Nanoscale Devices.” Solid State Phenomena. Ed. P Pichler. Vol. 242. Stafa-Zürich, Switzerland: Trans Tech, 2016. 449–458. Print.
- APA
- Simoen, Eddy, Cretu, B., Fang, W., Aoulaiche, M., Routoure, J.-M., Carin, R., Luo, J., et al. (2016). Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices. In P. Pichler (Ed.), Solid State Phenomena (Vol. 242, pp. 449–458). Presented at the Gettering and Defect Engineering in Semiconductor Technology 2015 (GADEST 2015): 30 Years of GADEST, Stafa-Zürich, Switzerland: Trans Tech.
- Chicago author-date
- Simoen, Eddy, Bogdan Cretu, Wen Fang, Marc Aoulaiche, Jean-Marc Routoure, Regis Carin, Jun Luo, Chao Zhao, and Cor Claeys. 2016. “Low-frequency Noise Spectroscopy of Bulk and Border Traps in Nanoscale Devices.” In Solid State Phenomena, ed. P Pichler, 242:449–458. Stafa-Zürich, Switzerland: Trans Tech.
- Chicago author-date (all authors)
- Simoen, Eddy, Bogdan Cretu, Wen Fang, Marc Aoulaiche, Jean-Marc Routoure, Regis Carin, Jun Luo, Chao Zhao, and Cor Claeys. 2016. “Low-frequency Noise Spectroscopy of Bulk and Border Traps in Nanoscale Devices.” In Solid State Phenomena, ed. P Pichler, 242:449–458. Stafa-Zürich, Switzerland: Trans Tech.
- Vancouver
- 1.Simoen E, Cretu B, Fang W, Aoulaiche M, Routoure J-M, Carin R, et al. Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices. In: Pichler P, editor. Solid State Phenomena. Stafa-Zürich, Switzerland: Trans Tech; 2016. p. 449–58.
- IEEE
- [1]E. Simoen et al., “Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices,” in Solid State Phenomena, Bad Staffelstein, Germany, 2016, vol. 242, pp. 449–458.
@inproceedings{6942633,
author = {Simoen, Eddy and Cretu, Bogdan and Fang, Wen and Aoulaiche, Marc and Routoure, Jean-Marc and Carin, Regis and Luo, Jun and Zhao, Chao and Claeys, Cor},
booktitle = {Solid State Phenomena},
editor = {Pichler, P},
isbn = {9783038356080},
issn = {1012-0394},
language = {eng},
location = {Bad Staffelstein, Germany},
pages = {449--458},
publisher = {Trans Tech},
title = {Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices},
url = {http://dx.doi.org/10.4028/www.scientific.net/SSP.242.449},
volume = {242},
year = {2016},
}
- Altmetric
- View in Altmetric