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Efficient statistical simulation of microwave devices via stochastic testing-based circuit equivalents of nonlinear components

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Abstract
This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and "black-box" approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the "stochastic testing" method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted.
Keywords
YIELD ESTIMATION, uncertainty, UNCERTAINTY, SYSTEMS, Circuit simulation, microwave circuits, nonlinear circuits, tolerance analysis, statistical analysis, SPICE, polynomial chaos (PC), power amplifiers, VARIABILITY ANALYSIS, POLYNOMIAL-CHAOS EXPANSION

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Citation

Please use this url to cite or link to this publication:

Chicago
Manfredi, Paolo, and Flavio Canavero. 2015. “Efficient Statistical Simulation of Microwave Devices via Stochastic Testing-based Circuit Equivalents of Nonlinear Components.” Ieee Transactions on Microwave Theory and Techniques 63 (5): 1502–1511.
APA
Manfredi, P., & Canavero, F. (2015). Efficient statistical simulation of microwave devices via stochastic testing-based circuit equivalents of nonlinear components. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 63(5), 1502–1511.
Vancouver
1.
Manfredi P, Canavero F. Efficient statistical simulation of microwave devices via stochastic testing-based circuit equivalents of nonlinear components. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 2015;63(5):1502–11.
MLA
Manfredi, Paolo, and Flavio Canavero. “Efficient Statistical Simulation of Microwave Devices via Stochastic Testing-based Circuit Equivalents of Nonlinear Components.” IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 63.5 (2015): 1502–1511. Print.
@article{6939942,
  abstract     = {This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and {\textacutedbl}black-box{\textacutedbl} approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the {\textacutedbl}stochastic testing{\textacutedbl} method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted.},
  author       = {Manfredi, Paolo and Canavero, Flavio},
  issn         = {0018-9480},
  journal      = {IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES},
  keyword      = {YIELD ESTIMATION,uncertainty,UNCERTAINTY,SYSTEMS,Circuit simulation,microwave circuits,nonlinear circuits,tolerance analysis,statistical analysis,SPICE,polynomial chaos (PC),power amplifiers,VARIABILITY ANALYSIS,POLYNOMIAL-CHAOS EXPANSION},
  language     = {eng},
  number       = {5},
  pages        = {1502--1511},
  title        = {Efficient statistical simulation of microwave devices via stochastic testing-based circuit equivalents of nonlinear components},
  url          = {http://dx.doi.org/10.1109/TMTT.2015.2417855},
  volume       = {63},
  year         = {2015},
}

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