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Three-dimensional X-ray imaging and analysis of fungi on and in wood

Jan Van den Bulcke UGent, Matthieu Boone UGent, Joris Van Acker UGent and Luc Van Hoorebeke UGent (2009) MICROSCOPY AND MICROANALYSIS. 15(5). p.395-402
abstract
As wood is prone to fungal degradation, fundamental research is necessary to increase our knowledge aiming at product improvement. Several imaging modalities are capable of visualizing fungi, but the X-ray equipment presented in this paper can envisage fungal mycelium in wood non-destructively in three dimensions with sub-micron resolution. Four types of wood subjected to the action of the white rot fungus Coriolus versicolor (Linnaeus) Quélet (CTB 863 A) were scanned using an X-ray based approach. Comparison of wood volumes before and after fungal exposure, segmented manually or semi-automatically, showed the presence of the fungal mass on and in the wood samples and therefore demonstrated the usefulness of computed X-ray tomography for mycological and wood research. Further improvements to the experimental set-up are necessary in order to resolve individual hyphae and enhance segmentation.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
MICROTOMOGRAPHY, QUANTIFICATION, RESISTANCE, TOMOGRAPHY, CONFOCAL MICROSCOPY, ROT DECAY, imaging, computed tomography (CT), SEM, 3D, X-ray, MELANIN, fungus, wood
journal title
MICROSCOPY AND MICROANALYSIS
Microsc. Microanal.
volume
15
issue
5
pages
395 - 402
Web of Science type
Article
Web of Science id
000270265600003
JCR category
MICROSCOPY
JCR impact factor
3.035 (2009)
JCR rank
1/9 (2009)
JCR quartile
1 (2009)
ISSN
1431-9276
DOI
10.1017/S1431927609990419
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
675607
handle
http://hdl.handle.net/1854/LU-675607
date created
2009-06-02 17:54:40
date last changed
2009-11-23 10:32:14
@article{675607,
  abstract     = {As wood is prone to fungal degradation, fundamental research is necessary to increase our knowledge aiming at product improvement. Several imaging modalities are capable of visualizing fungi, but the X-ray equipment presented in this paper can envisage fungal mycelium in wood non-destructively in three dimensions with sub-micron resolution. Four types of wood subjected to the action of the white rot fungus Coriolus versicolor (Linnaeus) Qu{\'e}let (CTB 863 A) were scanned using an X-ray based approach. Comparison of wood volumes before and after fungal exposure, segmented manually or semi-automatically, showed the presence of the fungal mass on and in the wood samples and therefore demonstrated the usefulness of computed X-ray tomography for mycological and wood research. Further improvements to the experimental set-up are necessary in order to resolve individual hyphae and enhance segmentation.},
  author       = {Van den Bulcke, Jan and Boone, Matthieu and Van Acker, Joris and Van Hoorebeke, Luc},
  issn         = {1431-9276},
  journal      = {MICROSCOPY AND MICROANALYSIS},
  keyword      = {MICROTOMOGRAPHY,QUANTIFICATION,RESISTANCE,TOMOGRAPHY,CONFOCAL MICROSCOPY,ROT DECAY,imaging,computed tomography (CT),SEM,3D,X-ray,MELANIN,fungus,wood},
  language     = {eng},
  number       = {5},
  pages        = {395--402},
  title        = {Three-dimensional X-ray imaging and analysis of fungi on and in wood},
  url          = {http://dx.doi.org/10.1017/S1431927609990419},
  volume       = {15},
  year         = {2009},
}

Chicago
Van den Bulcke, Jan, Matthieu Boone, Joris Van Acker, and Luc Van Hoorebeke. 2009. “Three-dimensional X-ray Imaging and Analysis of Fungi on and in Wood.” Microscopy and Microanalysis 15 (5): 395–402.
APA
Van den Bulcke, J., Boone, M., Van Acker, J., & Van Hoorebeke, L. (2009). Three-dimensional X-ray imaging and analysis of fungi on and in wood. MICROSCOPY AND MICROANALYSIS, 15(5), 395–402.
Vancouver
1.
Van den Bulcke J, Boone M, Van Acker J, Van Hoorebeke L. Three-dimensional X-ray imaging and analysis of fungi on and in wood. MICROSCOPY AND MICROANALYSIS. 2009;15(5):395–402.
MLA
Van den Bulcke, Jan, Matthieu Boone, Joris Van Acker, et al. “Three-dimensional X-ray Imaging and Analysis of Fungi on and in Wood.” MICROSCOPY AND MICROANALYSIS 15.5 (2009): 395–402. Print.