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Low frequency noise spectroscopy of bulk and border traps in nanoscale devices

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Chicago
Simoen, Eddy, B Cretu, W Fang, M Aoulaiche, JM Routoure, R Carin, J Luo, C Zhao, and C Claeys. 2015. “Low Frequency Noise Spectroscopy of Bulk and Border Traps in Nanoscale Devices.” In GADEST, Abstracts.
APA
Simoen, Eddy, Cretu, B., Fang, W., Aoulaiche, M., Routoure, J., Carin, R., Luo, J., et al. (2015). Low frequency noise spectroscopy of bulk and border traps in nanoscale devices. GADEST, Abstracts. Presented at the Gettering and Defect Engineering in Semiconductor Technology 2015 (GADEST 2015): 30 Years of GADEST.
Vancouver
1.
Simoen E, Cretu B, Fang W, Aoulaiche M, Routoure J, Carin R, et al. Low frequency noise spectroscopy of bulk and border traps in nanoscale devices. GADEST, Abstracts. 2015.
MLA
Simoen, Eddy, B Cretu, W Fang, et al. “Low Frequency Noise Spectroscopy of Bulk and Border Traps in Nanoscale Devices.” GADEST, Abstracts. 2015. Print.
@inproceedings{5969523,
  author       = {Simoen, Eddy and Cretu, B and Fang, W and Aoulaiche, M and Routoure, JM and Carin, R and Luo, J and Zhao, C and Claeys, C},
  booktitle    = {GADEST, Abstracts},
  language     = {eng},
  location     = {Bad Staffelstein, Germany},
  title        = {Low frequency noise spectroscopy of bulk and border traps in nanoscale devices},
  year         = {2015},
}