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Synthesis and surface characterization of a patterned cuprite sample: preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system

(2015) APPLIED SURFACE SCIENCE. 332. p.657-664
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Keywords
XEOM, Cu2O, XEOL, CuO, XRD, XPS, X-ray absorption spectroscopy, ABSORPTION SPECTROSCOPY, WATER-VAPOR, PHOTOELECTRON-SPECTROSCOPY, CORROSION MEASUREMENTS, SYNCHROTRON-RADIATION, CULTURAL-HERITAGE, XPS ANALYSIS, THIN-FILM, COPPER, OXIDATION

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Citation

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MLA
Sabbe, Pieter-Jan, et al. “Synthesis and Surface Characterization of a Patterned Cuprite Sample: Preparatory Step in the Evaluation Scheme of an X-Ray-Excited Optical Microscopy System.” APPLIED SURFACE SCIENCE, vol. 332, 2015, pp. 657–64, doi:10.1016/j.apsusc.2015.01.200.
APA
Sabbe, P.-J., Dowsett, M., De Keersmaecker, M., Hand, M., Thompson, P., & Adriaens, M. (2015). Synthesis and surface characterization of a patterned cuprite sample: preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system. APPLIED SURFACE SCIENCE, 332, 657–664. https://doi.org/10.1016/j.apsusc.2015.01.200
Chicago author-date
Sabbe, Pieter-Jan, Mark Dowsett, Michel De Keersmaecker, Matthew Hand, Paul Thompson, and Mieke Adriaens. 2015. “Synthesis and Surface Characterization of a Patterned Cuprite Sample: Preparatory Step in the Evaluation Scheme of an X-Ray-Excited Optical Microscopy System.” APPLIED SURFACE SCIENCE 332: 657–64. https://doi.org/10.1016/j.apsusc.2015.01.200.
Chicago author-date (all authors)
Sabbe, Pieter-Jan, Mark Dowsett, Michel De Keersmaecker, Matthew Hand, Paul Thompson, and Mieke Adriaens. 2015. “Synthesis and Surface Characterization of a Patterned Cuprite Sample: Preparatory Step in the Evaluation Scheme of an X-Ray-Excited Optical Microscopy System.” APPLIED SURFACE SCIENCE 332: 657–664. doi:10.1016/j.apsusc.2015.01.200.
Vancouver
1.
Sabbe P-J, Dowsett M, De Keersmaecker M, Hand M, Thompson P, Adriaens M. Synthesis and surface characterization of a patterned cuprite sample: preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system. APPLIED SURFACE SCIENCE. 2015;332:657–64.
IEEE
[1]
P.-J. Sabbe, M. Dowsett, M. De Keersmaecker, M. Hand, P. Thompson, and M. Adriaens, “Synthesis and surface characterization of a patterned cuprite sample: preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system,” APPLIED SURFACE SCIENCE, vol. 332, pp. 657–664, 2015.
@article{5863362,
  author       = {{Sabbe, Pieter-Jan and Dowsett, Mark and De Keersmaecker, Michel and Hand, Matthew and Thompson, Paul and Adriaens, Mieke}},
  issn         = {{0169-4332}},
  journal      = {{APPLIED SURFACE SCIENCE}},
  keywords     = {{XEOM,Cu2O,XEOL,CuO,XRD,XPS,X-ray absorption spectroscopy,ABSORPTION SPECTROSCOPY,WATER-VAPOR,PHOTOELECTRON-SPECTROSCOPY,CORROSION MEASUREMENTS,SYNCHROTRON-RADIATION,CULTURAL-HERITAGE,XPS ANALYSIS,THIN-FILM,COPPER,OXIDATION}},
  language     = {{eng}},
  pages        = {{657--664}},
  title        = {{Synthesis and surface characterization of a patterned cuprite sample: preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system}},
  url          = {{http://doi.org/10.1016/j.apsusc.2015.01.200}},
  volume       = {{332}},
  year         = {{2015}},
}

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