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Mechanistic modeling of architectural vulnerability factor

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Abstract
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an exponential increase in the number of transistors on chip and the reduction in operating voltages with each process generation. Architectural Vulnerability Factor (AVF) modeling using microarchitectural simulators enables architects to make informed performance, power, and reliability tradeoffs. However, such simulators are time-consuming and do not reveal the microarchitectural mechanisms that influence AVF. In this article, we present an accurate first-order mechanistic analytical model to compute AVF, developed using the first principles of an out-of-order superscalar execution. This model provides insight into the fundamental interactions between the workload and microarchitecture that together influence AVF. We use the model to perform design space exploration, parametric sweeps, and workload characterization for AVF.
Keywords
availability, Design, Computer architecture, reliability, Modeling, Methodology, analytical modeling, mechanistic modeling, Architectural Vulnerability Factor, reliability, soft errors, servicability (RAS). SOFT ERRORS

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Please use this url to cite or link to this publication:

MLA
Nair, Arun et al. “Mechanistic Modeling of Architectural Vulnerability Factor.” ACM TRANSACTIONS ON COMPUTER SYSTEMS 32.4 (2015): n. pag. Print.
APA
Nair, A., Eyerman, S., Chen, J., John, L., & Eeckhout, L. (2015). Mechanistic modeling of architectural vulnerability factor. ACM TRANSACTIONS ON COMPUTER SYSTEMS, 32(4).
Chicago author-date
Nair, Arun, Stijn Eyerman, Jian Chen, Lizy John, and Lieven Eeckhout. 2015. “Mechanistic Modeling of Architectural Vulnerability Factor.” Acm Transactions on Computer Systems 32 (4).
Chicago author-date (all authors)
Nair, Arun, Stijn Eyerman, Jian Chen, Lizy John, and Lieven Eeckhout. 2015. “Mechanistic Modeling of Architectural Vulnerability Factor.” Acm Transactions on Computer Systems 32 (4).
Vancouver
1.
Nair A, Eyerman S, Chen J, John L, Eeckhout L. Mechanistic modeling of architectural vulnerability factor. ACM TRANSACTIONS ON COMPUTER SYSTEMS. 2015;32(4).
IEEE
[1]
A. Nair, S. Eyerman, J. Chen, L. John, and L. Eeckhout, “Mechanistic modeling of architectural vulnerability factor,” ACM TRANSACTIONS ON COMPUTER SYSTEMS, vol. 32, no. 4, 2015.
@article{5823577,
  abstract     = {Reliability to soft errors is a significant design challenge in modern microprocessors owing to an exponential increase in the number of transistors on chip and the reduction in operating voltages with each process generation. Architectural Vulnerability Factor (AVF) modeling using microarchitectural simulators enables architects to make informed performance, power, and reliability tradeoffs. However, such simulators are time-consuming and do not reveal the microarchitectural mechanisms that influence AVF. In this article, we present an accurate first-order mechanistic analytical model to compute AVF, developed using the first principles of an out-of-order superscalar execution. This model provides insight into the fundamental interactions between the workload and microarchitecture that together influence AVF. We use the model to perform design space exploration, parametric sweeps, and workload characterization for AVF.},
  articleno    = {11},
  author       = {Nair, Arun and Eyerman, Stijn and Chen, Jian and John, Lizy and Eeckhout, Lieven},
  issn         = {0734-2071},
  journal      = {ACM TRANSACTIONS ON COMPUTER SYSTEMS},
  keywords     = {availability,Design,Computer architecture,reliability,Modeling,Methodology,analytical modeling,mechanistic modeling,Architectural Vulnerability Factor,reliability,soft errors,servicability (RAS). SOFT ERRORS},
  language     = {eng},
  number       = {4},
  pages        = {32},
  title        = {Mechanistic modeling of architectural vulnerability factor},
  url          = {http://dx.doi.org/10.1145/2669364},
  volume       = {32},
  year         = {2015},
}

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