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Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability

(2015) MICROELECTRONICS RELIABILITY. 55(1). p.143-154
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PLACE-it
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MAXIMUM-LIKELIHOOD-ESTIMATION, FEM, meandered interconnect, high conductivity, stretchable interconnect, SMI, Weibull analysis, SILICON ELECTRONICS, CARBON NANOTUBES, CONDUCTORS, CIRCUITS, DESIGN, SILVER, FILMS

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Citation

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Chicago
Jablonski, Michal, Jan Vanfleteren, Thomas Vervust, Frederick Bossuyt, Riccardo Lucchini, Pasquale Vena, Hans De Vries, and Mario Gonzalez. 2015. “Impact of Geometry on Stretchable Meandered Interconnect Uniaxial Tensile Extension Fatigue Reliability.” Microelectronics Reliability 55 (1): 143–154.
APA
Jablonski, M., Vanfleteren, J., Vervust, T., Bossuyt, F., Lucchini, R., Vena, P., De Vries, H., et al. (2015). Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. MICROELECTRONICS RELIABILITY, 55(1), 143–154.
Vancouver
1.
Jablonski M, Vanfleteren J, Vervust T, Bossuyt F, Lucchini R, Vena P, et al. Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. MICROELECTRONICS RELIABILITY. Elsevier; 2015;55(1):143–54.
MLA
Jablonski, Michal, Jan Vanfleteren, Thomas Vervust, et al. “Impact of Geometry on Stretchable Meandered Interconnect Uniaxial Tensile Extension Fatigue Reliability.” MICROELECTRONICS RELIABILITY 55.1 (2015): 143–154. Print.
@article{5819504,
  author       = {Jablonski, Michal and Vanfleteren, Jan and Vervust, Thomas and Bossuyt, Frederick  and Lucchini, Riccardo and Vena, Pasquale and De Vries, Hans and Gonzalez, Mario},
  issn         = {0026-2714},
  journal      = {MICROELECTRONICS RELIABILITY},
  keyword      = {MAXIMUM-LIKELIHOOD-ESTIMATION,FEM,meandered interconnect,high conductivity,stretchable interconnect,SMI,Weibull analysis,SILICON ELECTRONICS,CARBON NANOTUBES,CONDUCTORS,CIRCUITS,DESIGN,SILVER,FILMS},
  language     = {eng},
  number       = {1},
  pages        = {143--154},
  publisher    = {Elsevier},
  title        = {Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability},
  url          = {http://dx.doi.org/10.1016/j.microrel.2014.09.009},
  volume       = {55},
  year         = {2015},
}

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