High spectral and spatial resolution X-ray transmission radiography and tomography
- Author
- Matthieu Boone (UGent) , Jan Garrevoet (UGent) , Pieter Tack (UGent) , Oliver Scharf, Laszlo Vincze (UGent) and Luc Van Hoorebeke (UGent)
- Organization
- Abstract
- In high-resolution radiography and tomography, the local intensity of the X-ray beam is typically measured using an energy-integrating detector system, thus discarding all information on the detected X-ray spectrum. Recently, several direct or hybrid detector systems have been developed which allow for single photon counting using one or more energy thresholds [1]. By measuring the same object at different energy thresholds, it becomes possible to discriminate between different materials in that object. However, this methodology only allows for a limited amount of information about the incident X-ray energy, and the spectral resolution is typically limited to approximately 1 keV. Recently, a new detector system was developed which is able to measure a full-field image at 2048 energy bins, at a spectral resolution comparable with state-of-the-art single-element spectroscopic detectors [2]. This system has already been used for full-field X-ray fluorescence tomography, yielding impressive results in a short measurement time. Here, we present the applicability of this detector in transmission radiography and tomography. The practical limitations of this methodology, which are mainly induced by the low countrate of the system are presented. Furthermore, several results in true spectroscopic X-ray radiography and tomography are presented.
- Keywords
- tomography, spectroscopy, X-ray, spectral CT
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-5778955
- MLA
- Boone, Matthieu, et al. “High Spectral and Spatial Resolution X-Ray Transmission Radiography and Tomography.” 12th International Conference on X-Ray Microscopy : Conference Program Handbook, 2014, pp. 151–151.
- APA
- Boone, M., Garrevoet, J., Tack, P., Scharf, O., Vincze, L., & Van Hoorebeke, L. (2014). High spectral and spatial resolution X-ray transmission radiography and tomography. 12th International Conference on X-Ray Microscopy : Conference Program Handbook, 151–151.
- Chicago author-date
- Boone, Matthieu, Jan Garrevoet, Pieter Tack, Oliver Scharf, Laszlo Vincze, and Luc Van Hoorebeke. 2014. “High Spectral and Spatial Resolution X-Ray Transmission Radiography and Tomography.” In 12th International Conference on X-Ray Microscopy : Conference Program Handbook, 151–151.
- Chicago author-date (all authors)
- Boone, Matthieu, Jan Garrevoet, Pieter Tack, Oliver Scharf, Laszlo Vincze, and Luc Van Hoorebeke. 2014. “High Spectral and Spatial Resolution X-Ray Transmission Radiography and Tomography.” In 12th International Conference on X-Ray Microscopy : Conference Program Handbook, 151–151.
- Vancouver
- 1.Boone M, Garrevoet J, Tack P, Scharf O, Vincze L, Van Hoorebeke L. High spectral and spatial resolution X-ray transmission radiography and tomography. In: 12th International conference on X-Ray Microscopy : conference program handbook. 2014. p. 151–151.
- IEEE
- [1]M. Boone, J. Garrevoet, P. Tack, O. Scharf, L. Vincze, and L. Van Hoorebeke, “High spectral and spatial resolution X-ray transmission radiography and tomography,” in 12th International conference on X-Ray Microscopy : conference program handbook, Melbourne, VIC, Australia, 2014, pp. 151–151.
@inproceedings{5778955, abstract = {{In high-resolution radiography and tomography, the local intensity of the X-ray beam is typically measured using an energy-integrating detector system, thus discarding all information on the detected X-ray spectrum. Recently, several direct or hybrid detector systems have been developed which allow for single photon counting using one or more energy thresholds [1]. By measuring the same object at different energy thresholds, it becomes possible to discriminate between different materials in that object. However, this methodology only allows for a limited amount of information about the incident X-ray energy, and the spectral resolution is typically limited to approximately 1 keV. Recently, a new detector system was developed which is able to measure a full-field image at 2048 energy bins, at a spectral resolution comparable with state-of-the-art single-element spectroscopic detectors [2]. This system has already been used for full-field X-ray fluorescence tomography, yielding impressive results in a short measurement time. Here, we present the applicability of this detector in transmission radiography and tomography. The practical limitations of this methodology, which are mainly induced by the low countrate of the system are presented. Furthermore, several results in true spectroscopic X-ray radiography and tomography are presented.}}, author = {{Boone, Matthieu and Garrevoet, Jan and Tack, Pieter and Scharf, Oliver and Vincze, Laszlo and Van Hoorebeke, Luc}}, booktitle = {{12th International conference on X-Ray Microscopy : conference program handbook}}, keywords = {{tomography,spectroscopy,X-ray,spectral CT}}, language = {{eng}}, location = {{Melbourne, VIC, Australia}}, pages = {{151--151}}, title = {{High spectral and spatial resolution X-ray transmission radiography and tomography}}, url = {{http://www.xrm2014.com/wp-content/uploads/XRM-2014-Handbook_web_20141024.pdf}}, year = {{2014}}, }