Image quality assessment demo: industry: University and Cross Domain collaboration in practice
- Author
- Asli Kumcu (UGent) , Benhur Ortiz Jaramillo (UGent) , Ljiljana Platisa (UGent) , Bart Goossens (UGent) , Wilfried Philips (UGent) and Robert Hofsink
- Organization
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PANORAMA Demo 2014 11 26 ENF biblio.pdf
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-5762875
- MLA
- Kumcu, Asli, et al. “Image Quality Assessment Demo: Industry: University and Cross Domain Collaboration in Practice.” The European Nanoelectronics Forum, Abstracts, 2014, pp. 1–1.
- APA
- Kumcu, A., Ortiz Jaramillo, B., Platisa, L., Goossens, B., Philips, W., & Hofsink, R. (2014). Image quality assessment demo: industry: University and Cross Domain collaboration in practice. The European Nanoelectronics Forum, Abstracts, 1–1.
- Chicago author-date
- Kumcu, Asli, Benhur Ortiz Jaramillo, Ljiljana Platisa, Bart Goossens, Wilfried Philips, and Robert Hofsink. 2014. “Image Quality Assessment Demo: Industry: University and Cross Domain Collaboration in Practice.” In The European Nanoelectronics Forum, Abstracts, 1–1.
- Chicago author-date (all authors)
- Kumcu, Asli, Benhur Ortiz Jaramillo, Ljiljana Platisa, Bart Goossens, Wilfried Philips, and Robert Hofsink. 2014. “Image Quality Assessment Demo: Industry: University and Cross Domain Collaboration in Practice.” In The European Nanoelectronics Forum, Abstracts, 1–1.
- Vancouver
- 1.Kumcu A, Ortiz Jaramillo B, Platisa L, Goossens B, Philips W, Hofsink R. Image quality assessment demo: industry: University and Cross Domain collaboration in practice. In: The European Nanoelectronics Forum, Abstracts. 2014. p. 1–1.
- IEEE
- [1]A. Kumcu, B. Ortiz Jaramillo, L. Platisa, B. Goossens, W. Philips, and R. Hofsink, “Image quality assessment demo: industry: University and Cross Domain collaboration in practice,” in The European Nanoelectronics Forum, Abstracts, Cannes, France, 2014, pp. 1–1.
@inproceedings{5762875,
author = {{Kumcu, Asli and Ortiz Jaramillo, Benhur and Platisa, Ljiljana and Goossens, Bart and Philips, Wilfried and Hofsink, Robert}},
booktitle = {{The European Nanoelectronics Forum, Abstracts}},
language = {{eng}},
location = {{Cannes, France}},
pages = {{1--1}},
title = {{Image quality assessment demo: industry: University and Cross Domain collaboration in practice}},
year = {{2014}},
}