Ghent University Academic Bibliography

Advanced

Image quality assessment demo: industry: University and Cross Domain collaboration in practice

Asli Kumcu UGent, Benhur Ortiz Jaramillo UGent, Ljiljana Platisa UGent, Bart Goossens UGent, Wilfried Philips UGent and Robert Hofsink (2014) The European Nanoelectronics Forum, Abstracts. p.1-1
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
The European Nanoelectronics Forum, Abstracts
pages
1 - 1
conference name
The European Nanoelectronics Forum
conference location
Cannes, France
conference start
2014-11-26
conference end
2014-11-27
project
Eniac PANORAMA
language
English
UGent publication?
yes
classification
C3
copyright statement
I have retained and own the full copyright for this publication
id
5762875
handle
http://hdl.handle.net/1854/LU-5762875
date created
2014-11-25 19:08:06
date last changed
2016-12-19 15:37:15
@inproceedings{5762875,
  author       = {Kumcu, Asli and Ortiz Jaramillo, Benhur and Platisa, Ljiljana and Goossens, Bart and Philips, Wilfried and Hofsink, Robert},
  booktitle    = {The European Nanoelectronics Forum, Abstracts},
  language     = {eng},
  location     = {Cannes, France},
  pages        = {1--1},
  title        = {Image quality assessment demo: industry: University and Cross Domain collaboration in practice},
  year         = {2014},
}

Chicago
Kumcu, Asli, Benhur Ortiz Jaramillo, Ljiljana Platisa, Bart Goossens, Wilfried Philips, and Robert Hofsink. 2014. “Image Quality Assessment Demo: Industry: University and Cross Domain Collaboration in Practice.” In The European Nanoelectronics Forum, Abstracts, 1–1.
APA
Kumcu, A., Ortiz Jaramillo, B., Platisa, L., Goossens, B., Philips, W., & Hofsink, R. (2014). Image quality assessment demo: industry: University and Cross Domain collaboration in practice. The European Nanoelectronics Forum, Abstracts (pp. 1–1). Presented at the The European Nanoelectronics Forum.
Vancouver
1.
Kumcu A, Ortiz Jaramillo B, Platisa L, Goossens B, Philips W, Hofsink R. Image quality assessment demo: industry: University and Cross Domain collaboration in practice. The European Nanoelectronics Forum, Abstracts. 2014. p. 1–1.
MLA
Kumcu, Asli, Benhur Ortiz Jaramillo, Ljiljana Platisa, et al. “Image Quality Assessment Demo: Industry: University and Cross Domain Collaboration in Practice.” The European Nanoelectronics Forum, Abstracts. 2014. 1–1. Print.