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Regression analysis of capacitance transients : a method to obtain information on the electric structure of thin-film solar cells

Johan Lauwaert (UGent) , Lisanne Van Puyvelde (UGent) and Henk Vrielinck (UGent)
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Chicago
Lauwaert, Johan, Lisanne Van Puyvelde, and Henk Vrielinck. 2014. “Regression Analysis of Capacitance Transients : a Method to Obtain Information on the Electric Structure of Thin-film Solar Cells.” In Photovoltaic Solar Energy, 29th European Conference, Abstracts.
APA
Lauwaert, Johan, Van Puyvelde, L., & Vrielinck, H. (2014). Regression analysis of capacitance transients : a method to obtain information on the electric structure of thin-film solar cells. Photovoltaic Solar Energy, 29th European conference, Abstracts. Presented at the 29th European Photovoltaic Solar Energy conference and exhibition (EU PVSEC 2014).
Vancouver
1.
Lauwaert J, Van Puyvelde L, Vrielinck H. Regression analysis of capacitance transients : a method to obtain information on the electric structure of thin-film solar cells. Photovoltaic Solar Energy, 29th European conference, Abstracts. 2014.
MLA
Lauwaert, Johan, Lisanne Van Puyvelde, and Henk Vrielinck. “Regression Analysis of Capacitance Transients : a Method to Obtain Information on the Electric Structure of Thin-film Solar Cells.” Photovoltaic Solar Energy, 29th European Conference, Abstracts. 2014. Print.
@inproceedings{5715356,
  author       = {Lauwaert, Johan and Van Puyvelde, Lisanne and Vrielinck, Henk},
  booktitle    = {Photovoltaic Solar Energy, 29th European conference, Abstracts},
  language     = {eng},
  location     = {Amsterdam, The Netherlands},
  title        = {Regression analysis of capacitance transients : a method to obtain information on the electric structure of thin-film solar cells},
  year         = {2014},
}