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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films

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Keywords
Thin films, Silicide, Rare earth, X-ray diffraction, Solid state reaction, Crystal structure, THICKNESS-DEPENDENT FORMATION, EPITAXIAL-GROWTH, SILICIDES, SILICON, METALS, PHASE

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Citation

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MLA
Geenen, Filip, Werner Knaepen, J Demeulemeester, et al. “On the Formation and Structural Properties of Hexagonal Rare Earth (Y, Gd, Dy, Er and Yb) Disilicide Thin Films.” JOURNAL OF ALLOYS AND COMPOUNDS 611 (2014): 149–156. Print.
APA
Geenen, F., Knaepen, W., Demeulemeester, J., De Keyser, K., Jordan-Sweet, J., Lavoie, C., Vantomme, A., et al. (2014). On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films. JOURNAL OF ALLOYS AND COMPOUNDS, 611, 149–156.
Chicago author-date
Geenen, Filip, Werner Knaepen, J Demeulemeester, Koen De Keyser, JL Jordan-Sweet, C Lavoie, A Vantomme, and Christophe Detavernier. 2014. “On the Formation and Structural Properties of Hexagonal Rare Earth (Y, Gd, Dy, Er and Yb) Disilicide Thin Films.” Journal of Alloys and Compounds 611: 149–156.
Chicago author-date (all authors)
Geenen, Filip, Werner Knaepen, J Demeulemeester, Koen De Keyser, JL Jordan-Sweet, C Lavoie, A Vantomme, and Christophe Detavernier. 2014. “On the Formation and Structural Properties of Hexagonal Rare Earth (Y, Gd, Dy, Er and Yb) Disilicide Thin Films.” Journal of Alloys and Compounds 611: 149–156.
Vancouver
1.
Geenen F, Knaepen W, Demeulemeester J, De Keyser K, Jordan-Sweet J, Lavoie C, et al. On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films. JOURNAL OF ALLOYS AND COMPOUNDS. 2014;611:149–56.
IEEE
[1]
F. Geenen et al., “On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films,” JOURNAL OF ALLOYS AND COMPOUNDS, vol. 611, pp. 149–156, 2014.
@article{5711103,
  author       = {Geenen, Filip and Knaepen, Werner and Demeulemeester, J and De Keyser, Koen and Jordan-Sweet, JL and Lavoie, C and Vantomme, A and Detavernier, Christophe},
  issn         = {0925-8388},
  journal      = {JOURNAL OF ALLOYS AND COMPOUNDS},
  keywords     = {Thin films,Silicide,Rare earth,X-ray diffraction,Solid state reaction,Crystal structure,THICKNESS-DEPENDENT FORMATION,EPITAXIAL-GROWTH,SILICIDES,SILICON,METALS,PHASE},
  language     = {eng},
  pages        = {149--156},
  title        = {On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films},
  url          = {http://dx.doi.org/10.1016/j.jallcom.2014.04.142},
  volume       = {611},
  year         = {2014},
}

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