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Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

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Keywords
CBRAM, Conductive filament, C-AFM, Resistive switching, RESISTIVE SWITCHING MEMORIES, GROWTH

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Chicago
Celano, Umberto, Ludovic Goux, Karl Opsomer, Martina Iapichino, Attilio Belmonte, Alexys Franquet, Ilse Hoflijk, Christophe Detavernier, Malgorzata Jurczak, and Wilfried Vandervorst. 2014. “Scanning Probe Microscopy as a Scalpel to Probe Filament Formation in Conductive Bridging Memory Devices.” Microelectronic Engineering 120: 67–70.
APA
Celano, Umberto, Goux, L., Opsomer, K., Iapichino, M., Belmonte, A., Franquet, A., Hoflijk, I., et al. (2014). Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices. MICROELECTRONIC ENGINEERING, 120, 67–70.
Vancouver
1.
Celano U, Goux L, Opsomer K, Iapichino M, Belmonte A, Franquet A, et al. Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices. MICROELECTRONIC ENGINEERING. 2014;120:67–70.
MLA
Celano, Umberto, Ludovic Goux, Karl Opsomer, et al. “Scanning Probe Microscopy as a Scalpel to Probe Filament Formation in Conductive Bridging Memory Devices.” MICROELECTRONIC ENGINEERING 120 (2014): 67–70. Print.
@article{5647901,
  author       = {Celano, Umberto and Goux, Ludovic and Opsomer, Karl and Iapichino, Martina and Belmonte, Attilio and Franquet, Alexys and Hoflijk, Ilse and Detavernier, Christophe and Jurczak, Malgorzata and Vandervorst, Wilfried},
  issn         = {0167-9317},
  journal      = {MICROELECTRONIC ENGINEERING},
  language     = {eng},
  pages        = {67--70},
  title        = {Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices},
  url          = {http://dx.doi.org/10.1016/j.mee.2013.06.001},
  volume       = {120},
  year         = {2014},
}

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