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Morphology and luminescence of solvothermally deposited (Ca,Sr)S:Eu2+ thin films

Philippe Smet UGent, Nursen Avci and Dirk Poelman UGent (2008) p.459-462
abstract
We recently optimized a low-temperature, solvothermal synthesis method which yields luminescent, single-crystalline (Ca,Sr)S:Eu2+ particles. We now modified the process to allow direct growth onto templated substrates. The as-grown layers show a bright and homogeneous photoluminescence, peaking at 615nm and 650nm for SrS:Eu and CaS:Eu respectively. x-ray diffraction measurements proved that the layers grown at a temperature of only 200°C are strongly crystalline, with almost perfect (200) out-of-plane orientation. Scanning electron microscopy was used to study the morphology of the thin films. The electroluminescent properties of the thin films are discussed. The main advantages of this innovative approach for the production of TFEL devices are the low-temperature process and potential scalability.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
solvothermal growth, sulfides, textured thin films, europium, luminescence
pages
4 pages
conference name
14th International Workshop on Inorganic and Organic Electroluminescence & 2008 Int. Conf. on the Science and Technology of Emissive Displays and Lighting
conference location
Rome, Italy
conference start
2008-09-09
conference end
2008-09-12
language
English
UGent publication?
yes
classification
C1
id
524787
handle
http://hdl.handle.net/1854/LU-524787
date created
2009-03-19 09:48:52
date last changed
2016-12-19 15:34:52
@inproceedings{524787,
  abstract     = {We recently optimized a low-temperature, solvothermal synthesis method which yields luminescent, single-crystalline (Ca,Sr)S:Eu2+ particles. We now modified the process to allow direct growth onto templated substrates. The as-grown layers show a bright and homogeneous photoluminescence, peaking at 615nm and 650nm for SrS:Eu and CaS:Eu respectively. x-ray diffraction measurements proved that the layers grown at a temperature of only 200{\textdegree}C are strongly crystalline, with almost perfect (200) out-of-plane orientation. Scanning electron microscopy was used to study the morphology of the thin films. The electroluminescent properties of the thin films are discussed. The main advantages of this innovative approach for the production of TFEL devices are the low-temperature process and potential scalability.},
  author       = {Smet, Philippe and Avci, Nursen and Poelman, Dirk},
  keyword      = {solvothermal growth,sulfides,textured thin films,europium,luminescence},
  language     = {eng},
  location     = {Rome, Italy},
  pages        = {459--462},
  title        = {Morphology and luminescence of solvothermally deposited (Ca,Sr)S:Eu2+ thin films},
  year         = {2008},
}

Chicago
Smet, Philippe, Nursen Avci, and Dirk Poelman. 2008. “Morphology and Luminescence of Solvothermally Deposited (Ca,Sr)S:Eu2+ Thin Films.” In , 459–462.
APA
Smet, Philippe, Avci, N., & Poelman, D. (2008). Morphology and luminescence of solvothermally deposited (Ca,Sr)S:Eu2+ thin films (pp. 459–462). Presented at the 14th International Workshop on Inorganic and Organic Electroluminescence & 2008 Int. Conf. on the Science and Technology of Emissive Displays and Lighting.
Vancouver
1.
Smet P, Avci N, Poelman D. Morphology and luminescence of solvothermally deposited (Ca,Sr)S:Eu2+ thin films. 2008. p. 459–62.
MLA
Smet, Philippe, Nursen Avci, and Dirk Poelman. “Morphology and Luminescence of Solvothermally Deposited (Ca,Sr)S:Eu2+ Thin Films.” 2008. 459–462. Print.